EP 2455771 A4 20140806 - MEASUREMENT DEVICE AND MEASUREMENT METHOD
Title (en)
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Title (de)
MESSVORRICHTUNG UND MESSVERFAHREN
Title (fr)
DISPOSITIF DE MESURE ET PROCÉDÉ DE MESURE
Publication
Application
Priority
- JP 2010061580 W 20100708
- JP 2009166489 A 20090715
Abstract (en)
[origin: EP2455771A1] Disclosed is means for quantifying resistance to soft errors in a logic circuit. A logic block group 120 having at least one set comprising a logic block having at least one logic circuit and a sequential circuit that inputs the output of the logic block is arranged in an irradiation region 110 of a high-energy particle irradiation device, and subjected to irradiation with high-energy particles. A control section 101 calculates the error rate of the logic circuit from the value obtained by subtracting the number of errors of the sequential circuit when the logic block of the logic block group 120 is bypassed, from the number of errors of the sequential circuit and the logic block of the logic block group 120.
IPC 8 full level
G01R 31/00 (2006.01); G01R 31/28 (2006.01); G01R 31/307 (2006.01); G01R 31/3181 (2006.01); G11C 11/412 (2006.01); G11C 29/04 (2006.01); G11C 29/56 (2006.01); H03K 19/003 (2006.01)
CPC (source: EP US)
G01R 31/31816 (2013.01 - EP US); G11C 11/4125 (2013.01 - EP US); G11C 29/04 (2013.01 - EP US); H03K 19/0033 (2013.01 - EP US); G01R 31/002 (2013.01 - EP US); G01R 31/307 (2013.01 - EP US)
Citation (search report)
- [A] US 2007011513 A1 20070111 - BISWAS ARIJIT [US], et al
- [A] JP 2001215255 A 20010810 - HITACHI LTD
- [A] JP 2006134938 A 20060525 - RENESAS TECH CORP
- See references of WO 2011007708A1
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR
DOCDB simple family (publication)
EP 2455771 A1 20120523; EP 2455771 A4 20140806; EP 2455771 B1 20150923; JP 2011023058 A 20110203; JP 5198375 B2 20130515; US 2012159269 A1 20120621; US 8892967 B2 20141118; WO 2011007708 A1 20110120
DOCDB simple family (application)
EP 10799766 A 20100708; JP 2009166489 A 20090715; JP 2010061580 W 20100708; US 201013384012 A 20100708