Global Patent Index - EP 2458372 B1

EP 2458372 B1 20130918 - Method for measuring small angle x-ray scattering

Title (en)

Method for measuring small angle x-ray scattering

Title (de)

Verfahren zum Messen von kleinwinkliger Röntgenstrahlstreuung

Title (fr)

Procédé pour la mesure de la diffusion de rayons x à angle de petite taille

Publication

EP 2458372 B1 20130918 (EN)

Application

EP 12153438 A 20060704

Priority

  • EP 06767830 A 20060704
  • JP 2005247473 A 20050829

Abstract (en)

[origin: EP1925932A1] A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small angle X-ray diffraction, and in-plane X-ray diffraction, etc., comprises an X-ray generating apparatus 11 for generating X-ray, an optic system 16 for forming the X-ray into a predetermined incident beam of X-ray, a sample holder portion 120 for mounting a sample to be measured thereon, to irradiate the incident beam of X-ray thereupon, a vacuum path 17 for passing through small angle X-ray from the sample, and an X-ray detector 18 for detecting the small angle X-ray passing through the vacuum path, wherein the sample holder portion is fixed on a support base 110, while attaching the X-ray generating apparatus, the optic system, the vacuum path and the X-ray detector on a bench 100, as well, to be rotatable around the sample holder portion, and thereby enabling plural numbers of measurements of small angle X-ray scattering.

IPC 8 full level

G01N 23/201 (2006.01)

CPC (source: EP US)

G01N 23/201 (2013.01 - EP US)

Designated contracting state (EPC)

DE GB

DOCDB simple family (publication)

EP 1925932 A1 20080528; EP 1925932 A4 20110921; EP 1925932 B1 20170222; EP 2458372 A1 20120530; EP 2458372 B1 20130918; JP 2008157968 A 20080710; JP 4559499 B2 20101006; JP 4669004 B2 20110413; JP WO2007026461 A1 20090326; US 2009213992 A1 20090827; US 8000444 B2 20110816; WO 2007026461 A1 20070308

DOCDB simple family (application)

EP 06767830 A 20060704; EP 12153438 A 20060704; JP 2006313299 W 20060704; JP 2007533127 A 20060704; JP 2008062724 A 20080312; US 6499006 A 20060704