EP 2463175 B1 20140319 - Method for locating surface defects
Title (en)
Method for locating surface defects
Title (de)
Verfahren zum Auffinden von Oberflächenfehlern
Title (fr)
Procédé de détection de défauts de surface
Publication
Application
Priority
AT 20562010 A 20101213
Abstract (en)
[origin: EP2463175A2] The method involves determining two mean values for two light intensities for a pixel sensor (21) and a time point. The criteria check the value for a time lag, where an edge of an outbreak or an error of the surface is detected, when the number of criteria is satisfied. Independent claims are also included for the following: (1) an apparatus for finding edges of outbreaks on the surface of elongated objects; (2) a method for improving the classification of errors; and (3) a data carrier with program.
IPC 8 full level
B61L 23/04 (2006.01); G01B 11/24 (2006.01); G01N 21/89 (2006.01); G01N 21/95 (2006.01)
CPC (source: EP)
B61L 23/045 (2013.01); G01B 11/24 (2013.01); G01N 21/9515 (2013.01); G01N 2021/8918 (2013.01)
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
DOCDB simple family (publication)
AT 509607 A4 20111015; AT 509607 B1 20111015; EP 2463175 A2 20120613; EP 2463175 A3 20120815; EP 2463175 B1 20140319
DOCDB simple family (application)
AT 20562010 A 20101213; EP 11450150 A 20111206