Global Patent Index - EP 2471047 A1

EP 2471047 A1 20120704 - REMOTE MEASUREMENT SYSTEM AND METHOD FOR CARRYING OUT A TEST METHOD ON A REMOTE OBJECT

Title (en)

REMOTE MEASUREMENT SYSTEM AND METHOD FOR CARRYING OUT A TEST METHOD ON A REMOTE OBJECT

Title (de)

FERNMESSSYSTEM UND VERFAHREN ZUM DURCHFÜHREN EINES PRÜFVERFAHRENS AN EINEM ENTFERNTEN OBJEKT

Title (fr)

SYSTÈME TÉLÉMÉTRIQUE ET PROCÉDÉ PERMETTANT D'EFFECTUER UN PROCESSUS DE CONTRÔLE SUR UN OBJET ÉLOIGNÉ

Publication

EP 2471047 A1 20120704 (DE)

Application

EP 10759597 A 20100825

Priority

  • DE 102009039256 A 20090828
  • US 23777809 P 20090828
  • EP 2010062382 W 20100825

Abstract (en)

[origin: CA2772373A1] The invention relates to a remote measurement system (2) comprising a test device (4) that is connected to at least one sensor (16) and used to examine an object, a switching unit (6) and a remotely arranged operating unit (10). The operating unit (10) can send control signals for actuating the test device (4) to the switching unit (6). A data processing unit (8) compresses a first measurement data flow originating from the test device (4) and sends a second measurement data flow to the operating unit (10). The data processing unit (8) performs a quantization process, which can be controlled by the control signals on the operating unit (10). An expert located remotely from the object to be tested can gain a direct and qualified impression on the operating unit about the course and results of an inspection or of an examination and can provide direction, for example with respect to proper handling or to changing a recording mode or a recording location. This highly accelerated expert support in the execution of complex examinations saves time and considerably optimizes the transfer of know-how and use of experienced experts.

IPC 8 full level

G07C 5/00 (2006.01)

CPC (source: EP US)

G07C 5/008 (2013.01 - EP US)

Citation (search report)

See references of WO 2011023720A1

Citation (examination)

VIRTANEN K ET AL: "A Current-Mode ADC with Adaptive Quantization", CONFERENCE PROCEEDINGS / IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) : MAY 23 - 26, 2005, INTERNATIONAL CONFERENCE CENTER, KOBE, JAPAN, IEEE SERVICE CENTER, PISCATAWAY, NJ, 23 May 2005 (2005-05-23), pages 3115 - 3118, XP010816252, ISBN: 978-0-7803-8834-5, DOI: 10.1109/ISCAS.2005.1465287

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR

DOCDB simple family (publication)

DE 102009039256 A1 20110303; CA 2772373 A1 20110303; CN 102640191 A 20120815; CN 102640191 B 20150506; EP 2471047 A1 20120704; US 2012179414 A1 20120712; WO 2011023720 A1 20110303

DOCDB simple family (application)

DE 102009039256 A 20090828; CA 2772373 A 20100825; CN 201080038439 A 20100825; EP 10759597 A 20100825; EP 2010062382 W 20100825; US 201213404284 A 20120224