Global Patent Index - EP 2511911 A2

EP 2511911 A2 20121017 - Diffraction grating for x-ray talbot interferometer, method of manufacturing the same, and x-ray talbot interferometer

Title (en)

Diffraction grating for x-ray talbot interferometer, method of manufacturing the same, and x-ray talbot interferometer

Title (de)

Diffraktionsgitter für Röntgen-Talbot-Interferometer, Verfahren zu seiner Herstellung und Röntgen-Talbot-Interferometer

Title (fr)

Réseau de diffraction d'interféromètre Talbot à rayons x, son procédé de fabrication et interféromètre Talbot à rayons x

Publication

EP 2511911 A2 20121017 (EN)

Application

EP 12164090 A 20120413

Priority

JP 2011090607 A 20110415

Abstract (en)

A diffraction grating (20) for an X-ray Talbot interferometer includes: a plurality of ridge-like X-ray absorbing portions (20b) made of a metal and formed on a substrate (22) along one direction at predetermined intervals; and a resin (26) interposed in a groove portion (20a) between neighboring X-ray absorbing portions of the plurality of ridge-like X-ray absorbing portions. The plurality of ridge-like X-ray absorbing portions are each formed of at least two unit metal layers (2b, 4b, and 6b) laminated perpendicularly to a surface of the substrate. The at least two unit metal layers are formed through cutting of a metal film.

IPC 8 full level

G21K 1/06 (2006.01)

CPC (source: EP)

G21K 1/06 (2013.01); G21K 1/062 (2013.01); G21K 2207/005 (2013.01)

Citation (applicant)

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

Designated extension state (EPC)

BA ME

DOCDB simple family (publication)

EP 2511911 A2 20121017; EP 2511911 A3 20131113; JP 2012225966 A 20121115

DOCDB simple family (application)

EP 12164090 A 20120413; JP 2011090607 A 20110415