Global Patent Index - EP 2622540 A1

EP 2622540 A1 20130807 - METHOD FOR CLASSIFYING PATTERNS IN IMAGE DATA RECORDS

Title (en)

METHOD FOR CLASSIFYING PATTERNS IN IMAGE DATA RECORDS

Title (de)

VERFAHREN ZUR KLASSIFIZIERUNG VON MUSTERN IN BILDDATENSÄTZEN

Title (fr)

PROCÉDÉ DE CLASSIFICATION DE MOTIFS DANS DES BLOCS DE DONNÉES D'IMAGE

Publication

EP 2622540 A1 20130807 (DE)

Application

EP 11771014 A 20110926

Priority

  • DE 102010046867 A 20100929
  • EP 2011004808 W 20110926

Abstract (en)

[origin: WO2012052106A1] The invention relates to a method for classifying patterns in image data records, wherein the classification comprises a fuzzy c-means clustering, wherein the method comprises detection of training image data records, wherein the training image data records contain image data relating to different classes of patterns, wavelet transformation of the training image data records in order to obtain a set of wavelet coefficients for each training image data record, determination of a set of statistical measures for each training image data record from the associated set of wavelet coefficients, classification of all sets of statistical measures for the training image data records in order to form clusters of the sets of statistical measures, wherein each cluster has a cluster centre, and wherein each cluster centre is assigned to one or more of the classes of patterns, determination of the clusters which have not been uniquely assigned and are assigned to a plurality of classes of patterns, and reclassification of the sets of statistical measures for the training image data records of the clusters which have not been uniquely assigned in order to form further clusters of the sets of statistical measures for each cluster which has not been uniquely assigned, wherein each further cluster has a further cluster centre, and wherein each further cluster centre is assigned to one or more of the classes of patterns.

IPC 8 full level

G06K 9/62 (2006.01)

CPC (source: EP US)

G06F 18/231 (2023.01 - EP US)

Citation (search report)

See references of WO 2012052106A1

Citation (examination)

VAN DE WOUWER G ET AL: "Statistical Texture Characterization from Discrete Wavelet Representations", IEEE TRANSACTIONS ON IMAGE PROCESSING, IEEE SERVICE CENTER, PISCATAWAY, NJ, US, vol. 8, no. 4, 1 April 1999 (1999-04-01), XP011026309, ISSN: 1057-7149

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

DOCDB simple family (publication)

DE 102010046867 A1 20120329; EP 2622540 A1 20130807; WO 2012052106 A1 20120426

DOCDB simple family (application)

DE 102010046867 A 20100929; EP 11771014 A 20110926; EP 2011004808 W 20110926