Global Patent Index - EP 2672247 B1

EP 2672247 B1 20180404 - Leak Testing Methods and Systems

Title (en)

Leak Testing Methods and Systems

Title (de)

Leckprüfungsverfahren und -systeme

Title (fr)

Procédés et systèmes de tests de fuite

Publication

EP 2672247 B1 20180404 (EN)

Application

EP 13170718 A 20130605

Priority

US 201261655624 P 20120605

Abstract (en)

[origin: EP2672246A1] Leak rate testing is an engineering challenge where on the one hand, engineers must meet strict leak rate standards on a wide range of products and systems from semiconductor packages through medical product packaging to chemical storage vessels and liquid / gas handling systems. On the other hand, they have to make the leak testing process low cost and independent of operator whilst in many applications making the process automated and fast as this step may otherwise become a manufacturing bottleneck. Accordingly embodiments of the invention address manufacturing requirements by providing for high accuracy flow based leak testing of large volumes, providing adaptive techniques for use during testing, providing equivalent circuit modeling techniques allowing optimization and parameter extraction to be simulated prior to manufacturing commitment, and providing for the automatic tuning of setup parameters.

IPC 8 full level

G05D 7/06 (2006.01); G01M 3/26 (2006.01)

CPC (source: EP US)

G01M 3/26 (2013.01 - EP US); G05D 7/0629 (2013.01 - US)

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

DOCDB simple family (publication)

EP 2672246 A1 20131211; EP 2672246 B1 20170719; EP 2672247 A1 20131211; EP 2672247 B1 20180404; ES 2638793 T3 20171024; US 2013325194 A1 20131205; US 2013325371 A1 20131205; US 9377374 B2 20160628

DOCDB simple family (application)

EP 13170717 A 20130605; EP 13170718 A 20130605; ES 13170717 T 20130605; US 201313910368 A 20130605; US 201313910375 A 20130605