Global Patent Index - EP 2724292 A1

EP 2724292 A1 20140430 - SYSTEMS AND METHODS FOR DETECTING A SPECULAR REFLECTION PATTERN FOR BIOMETRIC ANALYSIS

Title (en)

SYSTEMS AND METHODS FOR DETECTING A SPECULAR REFLECTION PATTERN FOR BIOMETRIC ANALYSIS

Title (de)

SYSTEME UND VERFAHREN ZUR ERKENNUNG EINES SPIEGELREFLEXIONSMUSTERS FÜR BIOMETRISCHE ANALYSEN

Title (fr)

SYSTÈMES ET PROCÉDÉS POUR DÉTECTER UN MOTIF DE RÉFLEXION SPÉCULAIRE POUR UNE ANALYSE BIOMÉTRIQUE

Publication

EP 2724292 A1 20140430 (EN)

Application

EP 12802809 A 20120618

Priority

  • US 201161498529 P 20110618
  • US 2012042904 W 20120618

Abstract (en)

[origin: WO2012177542A1] Embodiments provide rapid detection of specular reflection patterns in eye images, which can then be analyzed to determine the quality of the image for biometric analysis. For example, systems and methods receive at least one image of an eye from an image capture system. The image capture system includes a camera and one or more illuminators that direct light at the eye while the camera captures the at least one image. The eye reflects the light from the illuminators to create a specular reflection pattern in the at least one image. The specular reflection pattern is located/identified and a quality of the at least one image of the eye, e.g., a focus measure, is determined based on the specular reflection pattern. A location of iris texture in the at least one image may be identified according to a location of the specular reflection pattern and analyzed for a focus measure.

IPC 8 full level

G06K 9/00 (2006.01); G06K 9/32 (2006.01)

CPC (source: EP)

G06V 10/245 (2022.01); G06V 40/19 (2022.01)

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

DOCDB simple family (publication)

WO 2012177542 A1 20121227; EP 2724292 A1 20140430; EP 2724292 A4 20150506

DOCDB simple family (application)

US 2012042904 W 20120618; EP 12802809 A 20120618