Global Patent Index - EP 2729789 A1

EP 2729789 A1 20140514 - MULTI-ANALYZER ANGLE SPECTROSCOPIC ELLIPSOMETRY

Title (en)

MULTI-ANALYZER ANGLE SPECTROSCOPIC ELLIPSOMETRY

Title (de)

WINKELSPEKTROSKOPELLIPSOMETRIE FÜR MEHRERE ANALYSEGERÄTE

Title (fr)

ELLIPSOMÉTRIE SPECTROSCOPIQUE À MULTIPLES ANGLES D'ANALYSEUR

Publication

EP 2729789 A1 20140514 (EN)

Application

EP 12807285 A 20120703

Priority

  • US 201161505403 P 20110707
  • US 201213536605 A 20120628
  • US 2012045436 W 20120703

Abstract (en)

[origin: WO2013006637A1] Ellipsometry systems and ellipsometry data collection methods with improved stabilities are disclosed. In accordance with the present disclosure, multiple predetermined, discrete analyzer angles are utilized to collect ellipsometry data for a single measurement, and data regression is performed based on the ellipsometry data collected at these predetermined, discrete analyzer angles. Utilizing multiple discrete analyzer angles for a single measurement improves the stability of the ellipsometry system.

IPC 8 full level

G01N 21/21 (2006.01); G01J 4/00 (2006.01)

CPC (source: EP)

G01J 4/00 (2013.01); G01N 21/211 (2013.01); G01N 2021/213 (2013.01)

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

DOCDB simple family (publication)

WO 2013006637 A1 20130110; EP 2729789 A1 20140514; EP 2729789 A4 20150318; JP 2014524028 A 20140918; TW 201314173 A 20130401; TW I558975 B 20161121

DOCDB simple family (application)

US 2012045436 W 20120703; EP 12807285 A 20120703; JP 2014519266 A 20120703; TW 101124514 A 20120706