EP 2729820 A4 20150401 - METHOD TO USE A PROBE TO MONITOR INTERFACIAL CHANGES OF CAPACITANCE AND RESISTANCE
Title (en)
METHOD TO USE A PROBE TO MONITOR INTERFACIAL CHANGES OF CAPACITANCE AND RESISTANCE
Title (de)
VERFAHREN ZUR VERWENDUNG EINER SONDE ZUR ÜBERWACHUNG DER GRENZFLÄCHENVERÄNDERUNGEN VON KAPAZITÄT UND WIDERSTAND
Title (fr)
PROCÉDÉ D'UTILISATION D'UNE SONDE POUR SURVEILLER DES MODIFICATIONS INTERFACIALES DE CAPACITÉ ET DE RÉSISTANCE
Publication
Application
Priority
- SE 1150650 A 20110708
- US 201161505624 P 20110708
- SE 2012050806 W 20120706
Abstract (en)
[origin: WO2013009251A1] The present invention relates to method to use a probe (1) adapted to monitor interfacial changes of capacitance and resistance. It is specifically taught that the probe consist of one single electrode, which electrode is in the form of a planar coil (11).
IPC 8 full level
G01R 27/26 (2006.01); G01N 27/02 (2006.01); G01N 27/04 (2006.01); G01N 27/07 (2006.01); G01N 27/22 (2006.01); G01R 27/22 (2006.01); G01F 23/26 (2022.01)
CPC (source: EP)
G01F 23/26 (2013.01); G01N 27/07 (2013.01)
Citation (search report)
- [XI] US 6782736 B1 20040831 - HAMMER ERLING [NO]
- [XI] US 2008174306 A1 20080724 - BRADY STEVEN K [US]
- [XI] EP 1747461 B1 20101215 - RANDOX LAB LTD [GB]
- [A] EP 1602921 A1 20051207 - SAMSUNG ELECTRONICS CO LTD [KR]
- See references of WO 2013009251A1
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
DOCDB simple family (publication)
WO 2013009251 A1 20130117; EP 2729820 A1 20140514; EP 2729820 A4 20150401
DOCDB simple family (application)
SE 2012050806 W 20120706; EP 12811945 A 20120706