EP 2773971 A1 20140910 - VARIABLE RESISTOR ARRANGEMENT, MEASUREMENT BRIDGE CIRCUIT AND METHOD FOR CALIBRATING A MEASUREMENT BRIDGE CIRCUIT
Title (en)
VARIABLE RESISTOR ARRANGEMENT, MEASUREMENT BRIDGE CIRCUIT AND METHOD FOR CALIBRATING A MEASUREMENT BRIDGE CIRCUIT
Title (de)
VARIABLE WIDERSTANDSANORDNUNG, MESSBRÜCKENSCHALTUNG UND VERFAHREN ZUM KALIBRIEREN EINER MESSBRÜCKENSCHALTUNG
Title (fr)
SYSTÈME VARIABLE DE RÉSISTANCE, CIRCUIT EN PONT DE MESURE ET PROCÉDÉ D'ÉTALONNAGE D'UN CIRCUIT EN PONT
Publication
Application
Priority
- DE 102011085555 A 20111102
- EP 2012067374 W 20120906
Abstract (en)
[origin: WO2013064294A1] The invention relates to a measurement bridge circuit (100), having a first and a second branch. The first branch contains a first resistor (R2(x)) which is sensitive to measured variables and an invariable resistor (Rfix,1) connected in series, with a first tap point (104) being arranged between the first resistor (R2(x)) which is sensitive to measured variables and the invariable resistor (Rfix,1). The second branch contains a second resistor (R1(x))which is sensitive to measured variables and a variable resistor arrangement (102) connected in series. The variable resistor arrangement (102) has a first component (Rfix,2) having an invariable electrical resistance value and a second component (M) having a variable electrical resistance value, the second component being connected in parallel with the first component (Rfix,2) in order to vary a total electrical resistance value for the resistor arrangement (102). A second tap point (106) is arranged between the second resistor (R1(x)) which is sensitive to measured variables and the resistor arrangement (102). The first branch and the second branch are connected in parallel. A measuring instrument can be arranged between the first tap point (104) and the second tap point (106).
IPC 8 full level
G01D 18/00 (2006.01); G01R 17/10 (2006.01); G01R 35/00 (2006.01)
CPC (source: EP US)
G01R 17/10 (2013.01 - EP US); G01R 27/02 (2013.01 - US); G01R 35/005 (2013.01 - EP US); H01C 10/16 (2013.01 - US)
Citation (search report)
See references of WO 2013064294A1
Citation (examination)
- US 7106120 B1 20060912 - HSU SHENG TENG [US]
- US 3893192 A 19750701 - JENSEN ARNE
- WO 2011099961 A1 20110818 - HEWLETT PACKARD DEVELOPMENT CO [US], et al
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
DOCDB simple family (publication)
DE 102011085555 A1 20130502; CN 104024870 A 20140903; CN 104024870 B 20170118; EP 2773971 A1 20140910; US 2014347072 A1 20141127; US 9568523 B2 20170214; WO 2013064294 A1 20130510
DOCDB simple family (application)
DE 102011085555 A 20111102; CN 201280053659 A 20120906; EP 12769964 A 20120906; EP 2012067374 W 20120906; US 201214353758 A 20120906