Global Patent Index - EP 2791618 A4

EP 2791618 A4 20150729 - NON-CONTACT SURFACE CHARACTERIZATION USING MODULATED ILLUMINATION

Title (en)

NON-CONTACT SURFACE CHARACTERIZATION USING MODULATED ILLUMINATION

Title (de)

BERÜHRUNGSLOSE OBERFLÄCHENCHARAKTERISIERUNG MIT MODULIERTER BELEUCHTUNG

Title (fr)

CARACTÉRISATION DE SURFACE SANS CONTACT UTILISANT UN ÉCLAIRAGE MODULÉ

Publication

EP 2791618 A4 20150729 (EN)

Application

EP 11879165 A 20111212

Priority

US 2011064417 W 20111212

Abstract (en)

[origin: WO2013105922A2] Methods for forming a three-dimensional image of a test object include directing light to a surface of best-focus of an imaging optic, where the light has an intensity modulation in at least one direction in the surface of best-focus, scanning a test object relative to the imaging optic so that a surface of the measurement object passes through the surface of best-focus of the imaging optic as the test object is scanned, acquiring, for each of a series of positions of the test object during the scan, a single image of the measurement object using the imaging optic, in which the intensity modulation of the light in the surface of best-focus is different for successive images, and forming a three-dimensional image of the test object based on the acquired images.

IPC 8 full level

G01B 11/25 (2006.01); G02B 27/22 (2006.01)

CPC (source: EP)

G01B 11/24 (2013.01); G01B 11/2527 (2013.01)

Citation (search report)

  • [XYI] EP 1471327 A2 20041027 - MITUTOYO CORP [JP]
  • [Y] US 2011287387 A1 20111124 - CHEN SHOUPU [US], et al
  • [Y] US 2009103103 A1 20090423 - BERNER MARKUS [CH]
  • [XYI] KLAUS KÖRNER ET AL: "One-grating projection for absolute three-dimensional profiling", OPTICAL ENGINEERING, SOC. OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, BELLINGHAM, vol. 40, no. 8, 1 August 2001 (2001-08-01), pages 1653 - 1660, XP002505180, ISSN: 0091-3286, DOI: 10.1117/1.1385509
  • [A] ISHIHARA M ET AL: "THREE-DIMENSIONAL SURFACE MEASUREMENT USING GRATING PROJECTION METHOD BY DETECTING PHASE AND CONTRAST", PROCEEDINGS OF SPIE, S P I E - INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, US, vol. 3740, 1 January 1999 (1999-01-01), pages 114 - 117, XP000913843, ISSN: 0277-786X, DOI: 10.1117/12.347778
  • See references of WO 2013105922A2

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

DOCDB simple family (publication)

WO 2013105922 A2 20130718; WO 2013105922 A3 20130919; EP 2791618 A2 20141022; EP 2791618 A4 20150729; JP 2015505039 A 20150216

DOCDB simple family (application)

US 2011064417 W 20111212; EP 11879165 A 20111212; JP 2014545870 A 20111212