EP 2815243 A1 20141224 - ACTIVE PROBE FOR NEAR FIELD OPTICAL MICROSCOPY AND METHOD FOR ITS MANUFACTURE
Title (en)
ACTIVE PROBE FOR NEAR FIELD OPTICAL MICROSCOPY AND METHOD FOR ITS MANUFACTURE
Title (de)
AKTIVE SONDE FÜR OPTISCHE NAHFELD-MIKROSKOSPIE UND DEREN HERSTELLUNGSVERFAHREN
Title (fr)
SONDE ACTIVE POUR MICROSCOPIE OPTIQUE EN CHAMP PROCHE ET SON PROCÉDÉ DE FABRICATION
Publication
Application
Priority
- FR 1251495 A 20120217
- IB 2013050986 W 20130206
Abstract (en)
[origin: WO2013121324A1] The invention relates to an active probe for near-field optical microscopy, characterized in that it comprises a metal or metallized tip (PM) at the apex of which a nanoscale body (BP) is located, said body comprising a polymer matrix capable of, or containing a host (MH) capable of, emitting, under illumination, light (SH) at a wavelength different from that of the illumination. Process for manufacturing such a probe. .
IPC 8 full level
G01Q 60/20 (2010.01)
CPC (source: EP US)
G01Q 60/20 (2013.01 - EP US); G01Q 60/22 (2013.01 - EP US)
Citation (search report)
See references of WO 2013121324A1
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
DOCDB simple family (publication)
WO 2013121324 A1 20130822; EP 2815243 A1 20141224; FR 2987131 A1 20130823; FR 2987131 B1 20150320; US 2016077127 A1 20160317; US 9784761 B2 20171010
DOCDB simple family (application)
IB 2013050986 W 20130206; EP 13712362 A 20130206; FR 1251495 A 20120217; US 201314377627 A 20130206