EP 2819162 A1 20141231 - Method for producing contact areas on a semiconductor substrate
Title (en)
Method for producing contact areas on a semiconductor substrate
Title (de)
Verfahren zur Herstellung von Kontaktbereichen auf einem Halbleitersubstrat
Title (fr)
Procédé de production de zones de contact sur un substrat semi-conducteur
Publication
Application
Priority
EP 13173335 A 20130624
Abstract (en)
The present invention is related to a method for producing hollow contact areas suitable for insertion bonding, formed on a semiconductor substrate (1) comprising a stack of one or more metallization layers on its surface. Openings are etched in a dielectric layer by plasma etching, using a resist layer as a mask. The resist material and the plasma etch parameters are chosen so as to obtain openings with sloped sidewalls that have a predefined slope, due to the controlled formation of a polymer layer forming on the sidewalls of the resist hole and the hollow contact opening formed during the etch step. According to a preferred embodiment, metal deposited in the hollow contact areas and on top of the dielectric is planarized using Chemical Mechanical Polishing, leading to mutually isolated contact areas. An array of such areas can be produced having smaller pitch compared to prior art arrays. The invention is equally related to components obtainable by the method of the invention, and to a package comprising such components.
IPC 8 full level
H01L 23/498 (2006.01); H01L 21/48 (2006.01)
CPC (source: CN EP US)
H01L 21/4853 (2013.01 - CN EP US); H01L 23/49811 (2013.01 - CN EP US); H01L 24/03 (2013.01 - US); H01L 24/06 (2013.01 - US); H01J 2237/334 (2013.01 - US); H01J 2237/3342 (2013.01 - US); H01J 2237/3347 (2013.01 - US); H01J 2237/3348 (2013.01 - US); H01J 2237/338 (2013.01 - US); H01J 2237/3382 (2013.01 - US); H01L 2224/03466 (2013.01 - US); H01L 2224/0401 (2013.01 - US); H01L 2224/0601 (2013.01 - US); H01L 2224/16237 (2013.01 - CN EP US)
Citation (applicant)
US 2005148180 A1 20050707 - SIVAKUMAR SWAMINATHAN [US], et al
Citation (search report)
- [XYI] US 6214716 B1 20010410 - AKRAM SALMAN [US]
- [Y] US 6040247 A 20000321 - CHUNG SEONG WOO [KR]
- [A] US 6335275 B1 20020101 - YABATA ATSUSHI [JP], et al
- [XI] US 2005148180 A1 20050707 - SIVAKUMAR SWAMINATHAN [US], et al
- [A] EP 2273545 A1 20110112 - IMEC [BE], et al
- [A] JP 2008147317 A 20080626 - MATSUSHITA ELECTRIC IND CO LTD
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
DOCDB simple family (publication)
EP 2819162 A1 20141231; EP 2819162 B1 20200617; CN 104282577 A 20150114; US 10332850 B2 20190625; US 2014374919 A1 20141225
DOCDB simple family (application)
EP 13173335 A 20130624; CN 201410282832 A 20140623; US 201414313664 A 20140624