EP 2857922 A1 20150408 - Circuits and method for controlling transient fault conditions in a low dropout voltage regulator
Title (en)
Circuits and method for controlling transient fault conditions in a low dropout voltage regulator
Title (de)
Schaltungen und Verfahren zur Steuerung von vorübergehenden Fehlerzuständen in einem Low-Dropout-Spannungsregler
Title (fr)
Circuits et procédé de commande de conditions de défaillance transitoire dans un régulateur à faible chute de tension
Publication
Application
Priority
EP 13368039 A 20131007
Abstract (en)
An overshoot reduction circuit within a low dropout voltage regulator eliminates an overshoot at an output terminal resulting from a transient fault condition occurring at an input or output terminal. The overshoot reduction circuit monitors to sense if there is a transient fault condition occurring at the input or output terminal and provides a Miller capacitance at the output terminal of a differential amplifier of the low dropout voltage regulator to prevent the output of the differential amplifier from being discharged to ground during the transient. A control loop circuit balances current within an active load of the differential amplifier to clamp the output of the differential amplifier to its normal operating point. When the transient fault condition ends, the output voltage of the differential amplifier is set such that a pass transistor of the low dropout regulator responds quickly to resume the regulation to reduce or eliminate the overshoot.
IPC 8 full level
G05F 1/56 (2006.01)
CPC (source: EP US)
G05F 1/462 (2013.01 - EP US); G05F 1/56 (2013.01 - EP US); G05F 1/575 (2013.01 - EP US); H02M 1/32 (2013.01 - US); H03F 3/45183 (2013.01 - EP US); H03F 2200/555 (2013.01 - EP US); H03F 2203/45314 (2013.01 - EP US); H03F 2203/45636 (2013.01 - EP US); H03F 2203/45674 (2013.01 - EP US); H03F 2203/45676 (2013.01 - EP US)
Citation (search report)
- [XA] US 2011156674 A1 20110630 - LIN CHUNG-WEI [TW], et al
- [XA] US 2007053115 A1 20070308 - TAIN YA-DER [TW], et al
- [A] US 2008265856 A1 20081030 - TAKADA SHUICHI [JP], et al
- [A] US 2006022652 A1 20060202 - NISHIMURA KAZUHIKO [JP], et al
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
DOCDB simple family (publication)
EP 2857922 A1 20150408; EP 3002659 A2 20160406; EP 3002659 A3 20160629; EP 3002659 B1 20230524; EP 3002659 B8 20230628; US 2015097534 A1 20150409; US 2016195884 A1 20160707; US 9292026 B2 20160322; US 9857816 B2 20180102
DOCDB simple family (application)
EP 13368039 A 20131007; EP 15188854 A 20131007; US 201314052838 A 20131014; US 201615072591 A 20160317