EP 2984913 A1 20160217 - SYSTEM AND METHOD FOR OPTICAL INSPECTION OF ELECTRONIC CIRCUITS
Title (en)
SYSTEM AND METHOD FOR OPTICAL INSPECTION OF ELECTRONIC CIRCUITS
Title (de)
VORRICHTUNG UND VERFAHREN ZUR OPTISCHEN INSPEKTION VON ELEKTRONISCHEN SCHALTUNGEN
Title (fr)
SYSTEME ET PROCEDE D'INSPECTION OPTIQUE DE CIRCUITS ELECTRONIQUES
Publication
Application
Priority
- FR 1353275 A 20130411
- FR 2014050853 W 20140409
Abstract (en)
[origin: WO2014167248A1] The invention relates to an optical inspection system (10) for electronic circuit (Card) comprising sensors (C) of images of the electronic circuit, at least two supports (22, 24) on which are intended to rest two parts of the electronic circuit and a device (20) for modifying the position of each support, independently of one another.
IPC 8 full level
H05K 13/08 (2006.01); G01N 21/956 (2006.01)
CPC (source: EP US)
G01N 21/95684 (2013.01 - EP US); H05K 13/0815 (2018.07 - EP US); G01N 2021/95638 (2013.01 - EP US)
Citation (search report)
See references of WO 2014167248A1
Citation (examination)
- US 2007218737 A1 20070920 - SUHARA SHINSUKE [JP]
- JP 2001153640 A 20010608 - ANRITSU CORP
- JP 2007311711 A 20071129 - ANRITSU CORP
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
DOCDB simple family (publication)
WO 2014167248 A1 20141016; EP 2984913 A1 20160217; FR 3004582 A1 20141017; FR 3004582 B1 20150410; KR 20150140704 A 20151216; US 2016054237 A1 20160225
DOCDB simple family (application)
FR 2014050853 W 20140409; EP 14720669 A 20140409; FR 1353275 A 20130411; KR 20157030835 A 20140409; US 201414783491 A 20140409