Global Patent Index - EP 3088952 B1

EP 3088952 B1 20200902 - MASK GROUP, PIXEL UNIT AND MANUFACTURING METHOD THEREFOR, ARRAY SUBSTRATE AND DISPLAY DEVICE

Title (en)

MASK GROUP, PIXEL UNIT AND MANUFACTURING METHOD THEREFOR, ARRAY SUBSTRATE AND DISPLAY DEVICE

Title (de)

MASKENGRUPPE, PIXELEINHEIT UND HERSTELLUNGSVERFAHREN DAFÜR, ARRAYSUBSTRAT UND ANZEIGEVORRICHTUNG

Title (fr)

GROUPE DE MASQUES, UNITÉ DE PIXELS ET SON PROCÉDÉ DE FABRICATION, SUBSTRAT DE MATRICE, ET DISPOSITIF D'AFFICHAGE

Publication

EP 3088952 B1 20200902 (EN)

Application

EP 14833563 A 20140704

Priority

  • CN 201310741648 A 20131227
  • CN 2014081631 W 20140704

Abstract (en)

[origin: US2016027816A1] A mask set, a pixel unit and a manufacturing method thereof, an array substrate and a display device are provided to overcome the problem of low brightness of a display screen of a display device. In the pixel unit, the maximum size value of an overlapped area between an active layer and a drain electrode of a thin-film transistor (TFT) in the direction parallel to data line is less than the size value of one side, overlapped with the data line, in an overlapped area between the active layer and a source electrode; and the source electrode is the portion of the data line disposed in an overlapped area between the active layer and the data line. The pixel unit has the advantages of a larger opening area and higher light transmittance. Thus, the brightness of a display screen of the display device comprising the pixel units can be enhanced. Moreover, the problem of screen flicker can be avoided to some extent, and hence the display quality of images can be improved.

IPC 8 full level

G02F 1/1362 (2006.01); H01L 27/12 (2006.01); H01L 29/786 (2006.01)

CPC (source: CN EP US)

G02F 1/136286 (2013.01 - EP US); G03F 1/38 (2013.01 - US); G03F 1/60 (2013.01 - CN); H01L 27/1214 (2013.01 - CN); H01L 27/1222 (2013.01 - EP US); H01L 27/124 (2013.01 - EP US); H01L 27/1288 (2013.01 - EP US); H01L 29/0684 (2013.01 - CN); H01L 29/41733 (2013.01 - EP US); H01L 29/42384 (2013.01 - EP US); H01L 29/66742 (2013.01 - CN); H01L 29/786 (2013.01 - CN); H01L 29/78696 (2013.01 - EP US); G02F 2201/40 (2013.01 - EP US)

Citation (examination)

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

DOCDB simple family (publication)

US 2016027816 A1 20160128; US 9640568 B2 20170502; CN 103715095 A 20140409; CN 103715095 B 20160120; EP 3088952 A1 20161102; EP 3088952 A4 20170705; EP 3088952 B1 20200902; JP 2017503220 A 20170126; JP 6449327 B2 20190109; KR 101730751 B1 20170511; KR 20150092112 A 20150812; WO 2015096449 A1 20150702

DOCDB simple family (application)

US 201414419745 A 20140704; CN 201310741648 A 20131227; CN 2014081631 W 20140704; EP 14833563 A 20140704; JP 2016561058 A 20140704; KR 20157012985 A 20140704