Global Patent Index - EP 3118887 A1

EP 3118887 A1 20170118 - MASS SPECTROMETRY METHOD AND MASS SPECTROMETRY DEVICE

Title (en)

MASS SPECTROMETRY METHOD AND MASS SPECTROMETRY DEVICE

Title (de)

MASSENSPEKTROMETRISCHES VERFAHREN UND MASSENSPEKTROMETER

Title (fr)

PROCÉDÉ DE SPECTROMÉTRIE DE MASSE ET DISPOSITIF DE SPECTROMÉTRIE DE MASSE

Publication

EP 3118887 A1 20170118 (EN)

Application

EP 14887871 A 20140331

Priority

JP 2014059458 W 20140331

Abstract (en)

The present invention is a mass spectrometer (1) for sequentially performing a measurement for a plurality of target ions, characterized by a storage section (41) for holding ion time-of-flight information concerning the time required for each of target ions to fly through each of the sections constituting the mass spectrometer, and a voltage controller (42) for changing, based on the ion time-of-flight information, the voltage applied to each of those sections to a voltage suited for each target ion, with a time lag corresponding to the difference in the timing of the arrival of the target ion at the section concerned.

IPC 8 full level

H01J 49/00 (2006.01); H01J 49/06 (2006.01); H01J 49/40 (2006.01); H01J 49/42 (2006.01)

CPC (source: EP US)

H01J 49/0027 (2013.01 - US); H01J 49/0031 (2013.01 - EP US); H01J 49/0095 (2013.01 - EP); H01J 49/421 (2013.01 - EP US); H01J 49/40 (2013.01 - EP US)

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

Designated extension state (EPC)

BA ME

DOCDB simple family (publication)

EP 3118887 A1 20170118; EP 3118887 A4 20170426; CN 106463338 A 20170222; CN 106463338 B 20190308; JP 6365661 B2 20180801; JP WO2015151160 A1 20170413; US 2017125233 A1 20170504; US 9899203 B2 20180220; WO 2015151160 A1 20151008

DOCDB simple family (application)

EP 14887871 A 20140331; CN 201480077804 A 20140331; JP 2014059458 W 20140331; JP 2016511187 A 20140331; US 201415300478 A 20140331