Global Patent Index - EP 3139400 A1

EP 3139400 A1 20170308 - POSITION CORRECTION SAMPLE, MASS SPECTROMETRY DEVICE, AND MASS SPECTROMETRY METHOD

Title (en)

POSITION CORRECTION SAMPLE, MASS SPECTROMETRY DEVICE, AND MASS SPECTROMETRY METHOD

Title (de)

POSITIONSKORREKTURPROBE, MASSENSPEKTROMETRIEVORRICHTUNG UND MASSENSPEKTROMETRIEVERFAHREN

Title (fr)

ÉCHANTILLON DE CORRECTION DE POSITION, DISPOSITIF DE SPECTROMÉTRIE DE MASSE ET PROCÉDÉ DE SPECTROMÉTRIE DE MASSE

Publication

EP 3139400 A1 20170308 (EN)

Application

EP 16185874 A 20160826

Priority

JP 2015174997 A 20150904

Abstract (en)

According to an embodiment, a position correction sample (20) is used to correct an irradiation position of an ion beam with respect to a sample platform where an analysis object is disposed in mass spectrometry. The position correction sample (20) comprises a stacked body (LB1). The stacked body includes a first layer (201), a second layer (202), and a third layer (203). The first layer includes a first material. The second layer is provided on the first layer. The second layer includes a second material. The third layer is provided on the second layer. The third layer includes a third material.

IPC 8 full level

H01J 49/00 (2006.01); H01J 49/14 (2006.01); H01J 49/16 (2006.01)

CPC (source: EP)

H01J 49/0004 (2013.01); H01J 49/0009 (2013.01); H01J 49/142 (2013.01); H01J 49/161 (2013.01)

Citation (search report)

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

Designated extension state (EPC)

BA ME

DOCDB simple family (publication)

EP 3139400 A1 20170308; EP 3139400 B1 20180228; JP 2017049216 A 20170309; JP 6430349 B2 20181128

DOCDB simple family (application)

EP 16185874 A 20160826; JP 2015174997 A 20150904