EP 3278118 A1 20180207 - INTEGRATED CIRCUIT (IC) TEST SOCKET WITH FARADAY CAGE BACKGROUND
Title (en)
INTEGRATED CIRCUIT (IC) TEST SOCKET WITH FARADAY CAGE BACKGROUND
Title (de)
INTEGRIERTER SCHALTKREISPRÜFSTECKER MIT FARADAYKÄFIG
Title (fr)
PRISE DE TEST DE CIRCUIT INTÉGRÉ (CI) AVEC ARRIÈRE-PLAN FORMANT CAGE DE FARADAY
Publication
Application
Priority
US 2015023839 W 20150401
Abstract (en)
[origin: WO2016160009A1] An integrated circuit test socket includes a highly conductive compliant material that is cut and installed into the test socket. The conductive material draws electrical charge away from the test socket, leading to more accurate testing. The test socket base is grounded, and a ground current runs through the base and into conductive strips. The configuration forms an electromagnetic impulse shield, protecting the chip from electromagnetic interference. The compliance of the shield material allows the shield to be sealed when activated, ensuring that the electromagnetic impulse shield is complete around the semi-conductor chip.
IPC 8 full level
G01R 1/02 (2006.01); G01R 1/067 (2006.01); G01R 1/18 (2006.01); H01L 21/66 (2006.01)
CPC (source: EP KR)
G01R 1/0466 (2013.01 - EP KR); G01R 1/18 (2013.01 - EP KR)
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
DOCDB simple family (publication)
WO 2016160009 A1 20161006; CN 107683416 A 20180209; EP 3278118 A1 20180207; EP 3278118 A4 20190116; JP 2018511806 A 20180426; KR 20170134612 A 20171206; PH 12017501810 A1 20180423; SG 11201708108V A 20171030
DOCDB simple family (application)
US 2015023839 W 20150401; CN 201580078675 A 20150401; EP 15888016 A 20150401; JP 2017551649 A 20150401; KR 20177031813 A 20150401; PH 12017501810 A 20171002; SG 11201708108V A 20150401