EP 3292561 A1 20180314 - METHOD FOR EXAMINING A GAS BY MASS SPECTROMETRY AND MASS SPECTROMETER
Title (en)
METHOD FOR EXAMINING A GAS BY MASS SPECTROMETRY AND MASS SPECTROMETER
Title (de)
VERFAHREN ZUR MASSENSPEKTROMETRISCHEN UNTERSUCHUNG EINES GASES UND MASSENSPEKTROMETER
Title (fr)
PROCÉDÉ D'ANALYSE D'UN GAZ PAR SPECTROMÉTRIE DE MASSE ET SPECTROMÈTRE DE MASSE
Publication
Application
Priority
- DE 102015208188 A 20150504
- EP 2016055842 W 20160317
Abstract (en)
[origin: WO2016177503A1] The invention relates to a method for examining a gas (4) by mass spectrometry, comprising: ionizing the gas (4) for producing ions (4a, 4b), and storing, exciting and detecting at least some of the produced ions (4a, 4b) in an FT ion trap (2). In the method, producing and storing the ions (4a, 4b) in the FT ion trap (2) and/or exciting the ions (4a, 4b) prior to the detection of the ions (4a, 4b) in the FT ion trap (2) comprises at least one selective IFT excitation, in particular a SWIFT excitation (10), which is dependent on the mass-to-charge ratio (m/z) of the ions (4a, 4b). The invention further relates to a mass spectrometer (1).
IPC 8 full level
H01J 49/00 (2006.01); H01J 49/02 (2006.01); H01J 49/38 (2006.01); H01J 49/42 (2006.01)
CPC (source: EP US)
H01J 49/0031 (2013.01 - EP US); H01J 49/38 (2013.01 - EP US); H01J 49/425 (2013.01 - EP US); H01J 49/426 (2013.01 - EP US); H01J 49/427 (2013.01 - US); H01J 49/4295 (2013.01 - US); H01J 49/027 (2013.01 - EP US)
Citation (search report)
See references of WO 2016177503A1
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
DOCDB simple family (publication)
WO 2016177503 A1 20161110; DE 102015208188 A1 20161124; EP 3292561 A1 20180314; EP 3292561 B1 20240501; JP 2018518019 A 20180705; JP 2020188007 A 20201119; JP 2020188008 A 20201119; JP 6734872 B2 20200805; JP 6948499 B2 20211013; JP 6948500 B2 20211013; US 10141174 B2 20181127; US 2018068842 A1 20180308
DOCDB simple family (application)
EP 2016055842 W 20160317; DE 102015208188 A 20150504; EP 16710230 A 20160317; JP 2017557937 A 20160317; JP 2020119144 A 20200710; JP 2020119145 A 20200710; US 201715795405 A 20171027