EP 3346484 A1 20180711 - X-RAY GENERATION DEVICE AND METHOD, AND SAMPLE MEASUREMENT SYSTEM
Title (en)
X-RAY GENERATION DEVICE AND METHOD, AND SAMPLE MEASUREMENT SYSTEM
Title (de)
RÖNTGENERZEUGUNGSVORRICHTUNG UND -VERFAHREN SOWIE PROBENMESSSYSTEM
Title (fr)
DISPOSITIF ET PROCÉDÉ DE GÉNÉRATION DE RAYONS X, ET SYSTÈME DE MESURE D'ÉCHANTILLON
Publication
Application
Priority
- JP 2015170101 A 20150831
- JP 2015214418 A 20151030
- JP 2016071811 W 20160726
Abstract (en)
Provided are: an X-ray generating device, an X-ray generating method, and a sample measurement system which have an extremely simple device configuration and are capable of selectively generating a linear or dot-like X-ray beam. The X-ray generating device (10) comprises an electron generator (24) and a rotating anticathode (26) which are fixed arranged in a positional relationship in which an electron source (32) and a circumferential surface portion (38) face one another while a rotation axis (36) is tilted with respect to a first direction (Z direction) and a second direction (X direction).
IPC 8 full level
H01J 35/26 (2006.01); H01J 35/06 (2006.01); H01J 35/10 (2006.01)
CPC (source: EP KR US)
H01J 35/064 (2019.04 - EP KR US); H01J 35/24 (2013.01 - EP); H01J 35/26 (2013.01 - KR); H01J 35/10 (2013.01 - EP); H01J 2235/066 (2013.01 - EP KR)
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
DOCDB simple family (publication)
EP 3346484 A1 20180711; EP 3346484 A4 20190501; EP 3346484 B1 20211013; KR 102106724 B1 20200504; KR 20180042328 A 20180425; MA 43905 A 20181205; WO 2017038302 A1 20170309
DOCDB simple family (application)
EP 16841334 A 20160726; JP 2016071811 W 20160726; KR 20187007655 A 20160726; MA 43905 A 20160726