Global Patent Index - EP 3346484 A4

EP 3346484 A4 20190501 - X-RAY GENERATION DEVICE AND METHOD, AND SAMPLE MEASUREMENT SYSTEM

Title (en)

X-RAY GENERATION DEVICE AND METHOD, AND SAMPLE MEASUREMENT SYSTEM

Title (de)

RÖNTGENERZEUGUNGSVORRICHTUNG UND -VERFAHREN SOWIE PROBENMESSSYSTEM

Title (fr)

DISPOSITIF ET PROCÉDÉ DE GÉNÉRATION DE RAYONS X, ET SYSTÈME DE MESURE D'ÉCHANTILLON

Publication

EP 3346484 A4 20190501 (EN)

Application

EP 16841334 A 20160726

Priority

  • JP 2015170101 A 20150831
  • JP 2015214418 A 20151030
  • JP 2016071811 W 20160726

Abstract (en)

[origin: EP3346484A1] Provided are: an X-ray generating device, an X-ray generating method, and a sample measurement system which have an extremely simple device configuration and are capable of selectively generating a linear or dot-like X-ray beam. The X-ray generating device (10) comprises an electron generator (24) and a rotating anticathode (26) which are fixed arranged in a positional relationship in which an electron source (32) and a circumferential surface portion (38) face one another while a rotation axis (36) is tilted with respect to a first direction (Z direction) and a second direction (X direction).

IPC 8 full level

H01J 35/26 (2006.01); H01J 35/06 (2006.01); H01J 35/10 (2006.01); H01J 35/24 (2006.01)

CPC (source: EP KR US)

H01J 35/064 (2019.04 - EP KR US); H01J 35/24 (2013.01 - EP); H01J 35/26 (2013.01 - KR); H01J 35/10 (2013.01 - EP); H01J 2235/066 (2013.01 - EP KR)

Citation (search report)

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

DOCDB simple family (publication)

EP 3346484 A1 20180711; EP 3346484 A4 20190501; EP 3346484 B1 20211013; KR 102106724 B1 20200504; KR 20180042328 A 20180425; MA 43905 A 20181205; WO 2017038302 A1 20170309

DOCDB simple family (application)

EP 16841334 A 20160726; JP 2016071811 W 20160726; KR 20187007655 A 20160726; MA 43905 A 20160726