Global Patent Index - EP 3377876 A1

EP 3377876 A1 20180926 - CALIBRATION PROBE AND METHOD FOR CALIBRATING AN ELECTRONIC DEVICE

Title (en)

CALIBRATION PROBE AND METHOD FOR CALIBRATING AN ELECTRONIC DEVICE

Title (de)

CALIBRATION PROBE AND METHOD FOR CALIBRATING AN ELECTRONIC DEVICE

Title (fr)

SONDE D'ÉTALONNAGE ET PROCÉDÉ D'ÉTALONNAGE D'UN DISPOSITIF ÉLECTRONIQUE

Publication

EP 3377876 A1 20180926 (EN)

Application

EP 16795052 A 20161114

Priority

  • EP 2015194657 W 20151116
  • EP 2016077540 W 20161114

IPC 8 full level

G01N 33/58 (2006.01); C12Q 1/6869 (2018.01); G01N 21/27 (2006.01); G01N 21/64 (2006.01)

CPC (source: EP)

G01N 21/278 (2013.01); G01N 33/582 (2013.01); C12Q 1/6869 (2013.01); G01N 2021/6439 (2013.01)

C-Set (source: EP)

C12Q 1/6869 + C12Q 2535/122 + C12Q 2545/113

Citation (search report)

See references of WO 2017084998A1

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

Designated extension state (EPC)

BA ME

DOCDB simple family (publication)

EP 3377876 A1 20180926

DOCDB simple family (application)

EP 16795052 A 20161114