Global Patent Index - EP 3379268 B1

EP 3379268 B1 20220504 - TEST AND MEASUREMENT DEVICE AND OPERATING METHOD

Title (en)

TEST AND MEASUREMENT DEVICE AND OPERATING METHOD

Title (de)

TEST- UND MESSVORRICHTUNG UND BETRIEBSVERFAHREN

Title (fr)

DISPOSITIF D'ESSAI ET DE MESURE ET PROCÉDÉ DE FONCTIONNEMENT

Publication

EP 3379268 B1 20220504 (EN)

Application

EP 17162484 A 20170323

Priority

EP 17162484 A 20170323

Abstract (en)

[origin: EP3379268A1] The present invention provides a test and measurement device (100, 200, 300) for testing an electronic device under test (150, 250, 350), the test and measurement device (100, 200, 300) comprising a test controller (101, 201, 301), which is configured to control the test and measurement device (100, 200, 300) to perform tests with the electronic device under test (150, 250, 350) based on respective user provided configuration parameters (102, 202, 302), and a memory device (103, 203, 303), which is coupled to the test controller (101, 201, 301), wherein the test controller (101, 201, 301) is configured to automatically store for every test in the memory device (103, 203, 303) a parameter set comprising the user provided configuration parameters (102, 202, 302). Further, the present invention provides an operating method for operating a test and measurement device (100, 200, 300).

IPC 8 full level

G01R 13/02 (2006.01); G01R 31/319 (2006.01)

CPC (source: CN EP US)

G01R 13/02 (2013.01 - EP US); G01R 13/06 (2013.01 - US); G01R 31/00 (2013.01 - CN); G01R 31/31908 (2013.01 - EP US); G01R 35/005 (2013.01 - US)

Designated contracting state (EPC)

AL AT BE BG CY CZ DE DK EE ES FI FR GB GR HR HU IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

DOCDB simple family (publication)

EP 3379268 A1 20180926; EP 3379268 B1 20220504; CN 108627718 A 20181009; CN 108627718 B 20220826; US 10768263 B2 20200908; US 2018275241 A1 20180927

DOCDB simple family (application)

EP 17162484 A 20170323; CN 201711389054 A 20171220; US 201715833163 A 20171206