Global Patent Index - EP 3475676 A1

EP 3475676 A1 20190501 - CALIBRATION PATTERN FOR AN IMAGING SYSTEM

Title (en)

CALIBRATION PATTERN FOR AN IMAGING SYSTEM

Title (de)

KALIBRIERUNGSMUSTER FÜR EIN BILDGEBUNGSSYSTEM

Title (fr)

MIRE D'ETALONNAGE POUR INSTALLATION DE PRISES DE VUES

Publication

EP 3475676 A1 20190501 (FR)

Application

EP 17745394 A 20170623

Priority

  • FR 1655980 A 20160627
  • FR 2017051686 W 20170623

Abstract (en)

[origin: WO2018002493A1] The invention relates to a calibration pattern (30) for an optical system, formed by a plate (32) comprising through-holes (38).

IPC 8 full level

G01M 11/00 (2006.01); G02B 21/00 (2006.01); G02B 27/32 (2006.01); G06T 7/80 (2017.01)

CPC (source: EP US)

G01N 21/8851 (2013.01 - US); G01N 21/9501 (2013.01 - US); G02B 21/0016 (2013.01 - EP); G02B 27/32 (2013.01 - EP US); G06T 7/001 (2013.01 - US); G06T 7/337 (2016.12 - US); G06T 7/80 (2016.12 - US); G01N 2021/8887 (2013.01 - US); G06T 2207/30141 (2013.01 - US)

Citation (search report)

See references of WO 2018002493A1

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

Designated extension state (EPC)

BA ME

DOCDB simple family (publication)

FR 3053127 A1 20171229; FR 3053127 B1 20190503; EP 3475676 A1 20190501; US 10909722 B2 20210202; US 2020202568 A1 20200625; WO 2018002493 A1 20180104; WO 2018002493 A4 20180222

DOCDB simple family (application)

FR 1655980 A 20160627; EP 17745394 A 20170623; FR 2017051686 W 20170623; US 201716304934 A 20170623