EP 3513206 A1 20190724 - TESTING SYSTEM AND METHOD
Title (en)
TESTING SYSTEM AND METHOD
Title (de)
TESTSYSTEM UND -VERFAHREN
Title (fr)
SYSTÈME ET PROCÉDÉ D'ESSAI
Publication
Application
Priority
- US 201662395806 P 20160916
- US 2017051275 W 20170913
Abstract (en)
[origin: WO2018052938A1] A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, and monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages. The plurality of monitored current values are stored.
IPC 8 full level
G01R 1/067 (2006.01); G01R 31/28 (2006.01); G01R 31/319 (2006.01); G01R 35/00 (2006.01); H01L 21/66 (2006.01)
CPC (source: EP US)
G01R 1/07378 (2013.01 - US); G01R 1/07385 (2013.01 - US); G01R 19/25 (2013.01 - US); G01R 31/2834 (2013.01 - EP US); G01R 31/31924 (2013.01 - EP US)
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
DOCDB simple family (publication)
WO 2018052938 A1 20180322; EP 3513206 A1 20190724; EP 3513206 A4 20200520; EP 3513207 A1 20190724; EP 3513207 A4 20200520; TW 201814311 A 20180416; TW 201830028 A 20180816; TW I653457 B 20190311; TW I655440 B 20190401; US 10379154 B2 20190813; US 10444278 B2 20191015; US 2018080978 A1 20180322; US 2018080979 A1 20180322; WO 2018052944 A1 20180322
DOCDB simple family (application)
US 2017051275 W 20170913; EP 17851419 A 20170913; EP 17851423 A 20170913; TW 106131776 A 20170915; TW 106131777 A 20170915; US 2017051281 W 20170913; US 201715703319 A 20170913; US 201715703351 A 20170913