EP 3580597 A2 20191218 - OPTICS, DEVICE, AND SYSTEM FOR ASSAYING
Title (en)
OPTICS, DEVICE, AND SYSTEM FOR ASSAYING
Title (de)
OPTIK, VORRICHTUNG UND SYSTEM ZUM TESTEN
Title (fr)
OPTIQUE, DISPOSITIF ET SYSTÈME D'ESSAI
Publication
Application
Priority
- US 201762456598 P 20170208
- US 201762456590 P 20170208
- US 201762456504 P 20170208
- US 201762456904 P 20170209
- US 201762457133 P 20170209
- US 201762459554 P 20170215
- US 201762460075 P 20170216
- US 201762460062 P 20170216
- US 2018017504 W 20180208
Abstract (en)
[origin: WO2018148471A2] The present invention provides, among other thing, devices and methods for simple, fast, and sensitive assaying, including imaging.
IPC 8 full level
G02B 21/00 (2006.01); G02B 21/24 (2006.01); G02B 21/33 (2006.01); G06K 9/00 (2006.01); H04N 5/225 (2006.01); H04N 5/232 (2006.01)
CPC (source: CN EP)
B01L 3/502715 (2013.01 - EP); B01L 9/52 (2013.01 - EP); G01N 21/6458 (2013.01 - CN); G01N 21/78 (2013.01 - CN); G01N 21/84 (2013.01 - CN); G01N 21/8483 (2013.01 - EP); G01N 33/483 (2013.01 - CN); G02B 7/023 (2013.01 - CN); G02B 21/0008 (2013.01 - CN EP); G02B 21/0076 (2013.01 - EP); G02B 21/12 (2013.01 - CN); G02B 21/16 (2013.01 - CN); G02B 21/24 (2013.01 - CN); H04N 23/51 (2023.01 - EP); H04N 23/55 (2023.01 - CN EP); H04N 23/56 (2023.01 - EP); H04N 23/57 (2023.01 - CN EP); H04N 23/67 (2023.01 - CN); B01L 2200/025 (2013.01 - EP)
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
DOCDB simple family (publication)
WO 2018148471 A2 20180816; WO 2018148471 A3 20181004; CA 3053009 A1 20180816; CN 111465882 A 20200728; CN 111465882 B 20230526; CN 116794819 A 20230922; EP 3580597 A2 20191218; EP 3580597 A4 20210505; JP 2020509403 A 20200326; JP 7177073 B2 20221122
DOCDB simple family (application)
US 2018017504 W 20180208; CA 3053009 A 20180208; CN 201880020973 A 20180208; CN 202310507084 A 20180208; EP 18751754 A 20180208; JP 2019543054 A 20180208