Global Patent Index - EP 3581878 A1

EP 3581878 A1 20191218 - REGISTRATION OF AN EXTENDED REFERENCE FOR PARAMETER MEASUREMENT IN AN OPTICAL SENSING SYSTEM

Title (en)

REGISTRATION OF AN EXTENDED REFERENCE FOR PARAMETER MEASUREMENT IN AN OPTICAL SENSING SYSTEM

Title (de)

REGISTRIERUNG EINER ERWEITERTEN REFERENZ ZUR PARAMETERMESSUNG IN EINEM OPTISCHEN ERFASSUNGSSYSTEM

Title (fr)

ENREGISTREMENT D'UNE RÉFÉRENCE ÉTENDUE POUR MESURE DE PARAMÈTRES DANS UN SYSTÈME DE DÉTECTION OPTIQUE

Publication

EP 3581878 A1 20191218 (EN)

Application

EP 19163646 A 20110531

Priority

  • US 35034310 P 20100601
  • US 201161434175 P 20110119
  • EP 11790271 A 20110531
  • US 2011038512 W 20110531

Abstract (en)

An interferometric measurement system measures a parameter using at least one optical waveguide. A memory stores reference interferometric pattern data associated with a segment of the optical waveguide. Interferometric detection circuitry detects and stores measurement interferometric pattern data associated with the segment of the optical waveguide during a measurement operation. A spectral range of the reference interferometric pattern of the optical waveguide is greater than a spectral range of the measurement interferometric pattern of the optical waveguide. A processor shifts one or both of the measurement interferometric pattern data and the reference interferometric pattern data relative to the other to obtain a match and to use the match to measure the parameter. An example parameter is strain.

IPC 8 full level

G01B 9/02 (2006.01); G01D 5/353 (2006.01); G01L 1/24 (2006.01); G01B 11/16 (2006.01)

CPC (source: EP)

G01B 9/02004 (2013.01); G01B 9/02023 (2013.01); G01B 9/02069 (2013.01); G01B 9/02084 (2013.01); G01B 9/02088 (2013.01); G01D 5/35361 (2013.01); G01L 1/242 (2013.01); G01B 11/161 (2013.01)

Citation (applicant)

  • US 35034310 P 20100601
  • US 201161434175 P 20110119
  • US 6545760 B1 20030408 - FROGGATT MARK E [US], et al
  • US 87490110 A 20100902
  • FROGGATT; MOORE: "High spatial resolution distributed strain measurement in optical fiber using Rayleigh scatter", APPLIED OPTICS, 1 April 1998 (1998-04-01)

Citation (search report)

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

DOCDB simple family (publication)

WO 2011153126 A2 20111208; WO 2011153126 A3 20120405; EP 2577222 A2 20130410; EP 2577222 A4 20170628; EP 2577222 B1 20190501; EP 3581878 A1 20191218; EP 3581878 B1 20210811

DOCDB simple family (application)

US 2011038512 W 20110531; EP 11790271 A 20110531; EP 19163646 A 20110531