Global Patent Index - EP 3828819 A4

EP 3828819 A4 20210901 - MACHINE LEARNING MODEL GENERATION DEVICE, METHOD, PROGRAM, INSPECTION DEVICE, INSPECTION METHOD, AND PRINT DEVICE

Title (en)

MACHINE LEARNING MODEL GENERATION DEVICE, METHOD, PROGRAM, INSPECTION DEVICE, INSPECTION METHOD, AND PRINT DEVICE

Title (de)

VORRICHTUNG, VERFAHREN, PROGRAMM, INSPEKTIONSVORRICHTUNG, INSPEKTIONSVERFAHREN UND DRUCKVORRICHTUNG

Title (fr)

DISPOSITIF DE GÉNÉRATION DE MODÈLE D'APPRENTISSAGE AUTOMATIQUE, PROCÉDÉ, PROGRAMME, DISPOSITIF D'INSPECTION, PROCÉDÉ D'INSPECTION ET DISPOSITIF D'IMPRESSION

Publication

EP 3828819 A4 20210901 (EN)

Application

EP 19840630 A 20190704

Priority

  • JP 2018139555 A 20180725
  • JP 2019026685 W 20190704

Abstract (en)

[origin: US2021114368A1] There is provided a machine learning model generation device, a machine learning model generation method, a program, an inspection device, an inspection method, and a printing device for inspecting a defect of a printed matter with high accuracy. A machine learning model for detecting the defect of the printed matter is generated by using, as learning input information, at least learning inspection data based on a captured image obtained by capturing an image of a printed matter as an inspection target and second learning reference data based on print digital data and using, as learning output information, at least learning defect information of the learning inspection data estimated by performing comparison processing of the learning inspection data and first learning reference data based on a captured image obtained by capturing the image of the printed matter.

IPC 8 full level

G06T 7/00 (2017.01); B41J 29/393 (2006.01)

CPC (source: EP US)

B41J 2/0451 (2013.01 - US); B41J 2/2142 (2013.01 - EP); B41J 2/2146 (2013.01 - EP); B41J 29/393 (2013.01 - US); G06N 3/084 (2013.01 - EP); G06N 20/00 (2019.01 - US); G06T 7/001 (2013.01 - EP US); H04N 1/00037 (2013.01 - EP US); H04N 1/00045 (2013.01 - EP US); G06N 3/045 (2023.01 - EP); G06N 20/00 (2019.01 - EP); G06T 2207/10024 (2013.01 - EP); G06T 2207/20081 (2013.01 - EP); G06T 2207/20084 (2013.01 - EP); G06T 2207/30144 (2013.01 - EP US)

Citation (search report)

  • [A] JP H07333170 A 19951222 - HEWTEC KK, et al
  • [A] MARIE VANS ET AL: "Automatic visual inspection and defect detection on variable data prints", JOURNAL OF ELECTRONIC IMAGING, 1 January 2011 (2011-01-01), pages 13010, XP055255728, Retrieved from the Internet <URL:https://www.spiedigitallibrary.org/journals/journal-of-electronic-imaging/volume-20/issue-1/013010/Automatic-visual-inspection-and-defect-detection-on-variable-data-prints/10.1117/1.3537837.full?SSO=1> [retrieved on 20160307], DOI: 10.1117/1.3537837
  • See also references of WO 2020022024A1

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

Designated extension state (EPC)

BA ME

DOCDB simple family (publication)

US 11820132 B2 20231121; US 2021114368 A1 20210422; EP 3828819 A1 20210602; EP 3828819 A4 20210901; EP 3828819 B1 20231018; JP 7110349 B2 20220801; JP WO2020022024 A1 20210802; WO 2020022024 A1 20200130

DOCDB simple family (application)

US 202017134654 A 20201228; EP 19840630 A 20190704; JP 2019026685 W 20190704; JP 2020532262 A 20190704