EP 4050676 A4 20220907 - NEGATIVE ELECTRODE SHEET, ELECTROCHEMICAL DEVICE COMPRISING NEGATIVE ELECTRODE SHEET, AND ELECTRONIC DEVICE
Title (en)
NEGATIVE ELECTRODE SHEET, ELECTROCHEMICAL DEVICE COMPRISING NEGATIVE ELECTRODE SHEET, AND ELECTRONIC DEVICE
Title (de)
NEGATIVE ELEKTRODENFOLIE, ELEKTROCHEMISCHE VORRICHTUNG, DIE EINE NEGATIVE ELEKTRODENFOLIE UMFASST, UND ELEKTRONISCHE VORRICHTUNG
Title (fr)
FEUILLE D'ÉLECTRODE NÉGATIVE, DISPOSITIF ÉLECTROCHIMIQUE COMPRENANT UNE FEUILLE D'ÉLECTRODE NÉGATIVE ET DISPOSITIF ÉLECTRONIQUE
Publication
Application
Priority
CN 2020140378 W 20201228
Abstract (en)
[origin: US2022231276A1] A negative electrode plate including a negative electrode material layer. The negative electrode material layer of the negative electrode plate includes silicon-based particles and graphite particles, and pores are created inside the silicon-based particles, so that porosity α1 of the silicon-based particles and a percentage B of silicon in the silicon-based particles satisfy P=0.5α1/(B-α1B), where 0.2≤P≤1.6, which can effectively alleviate swelling of the silicon-based particles during lithium intercalation, thereby improving cycling performance and reducing swelling and deformation of the electrochemical apparatus.
IPC 8 full level
H01M 4/134 (2010.01); H01M 4/02 (2006.01); H01M 4/133 (2010.01); H01M 4/36 (2006.01); H01M 4/38 (2006.01); H01M 4/48 (2010.01); H01M 4/587 (2010.01); H01M 4/62 (2006.01)
CPC (source: CN EP US)
H01M 4/133 (2013.01 - CN EP); H01M 4/134 (2013.01 - CN EP); H01M 4/1393 (2013.01 - CN); H01M 4/1395 (2013.01 - CN); H01M 4/364 (2013.01 - EP US); H01M 4/366 (2013.01 - EP); H01M 4/386 (2013.01 - CN EP US); H01M 4/483 (2013.01 - EP); H01M 4/583 (2013.01 - CN); H01M 4/587 (2013.01 - EP US); H01M 4/625 (2013.01 - CN EP); H01M 10/0525 (2013.01 - CN US); H01M 2004/021 (2013.01 - EP US); H01M 2004/027 (2013.01 - EP US); Y02E 60/10 (2013.01 - EP)
Citation (search report)
- [XYI] CN 107204431 A 20170926 - BYD CO LTD
- [XYI] CN 109273680 A 20190125 - SICHUAN XIDANFU ENERGY TECH CO LTD
- [XYI] CN 106876665 B 20190802
- [XYI] US 2016118655 A1 20160428 - YOSHIKAWA HIROKI [JP], et al
- [Y] JP 6448681 B2 20190109
- [A] "A Basic Guide to Particle Characterization", MALVERN INSTRUMENTS WORLDWIDE - WHITE PAPER, 2 May 2012 (2012-05-02), pages 1 - 26, XP055089322, Retrieved from the Internet <URL:http://golik.co.il/Data/ABasicGuidtoParticleCharacterization(2)_1962085150.pdf> [retrieved on 20220726]
- See references of WO 2022140982A1
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
DOCDB simple family (publication)
US 2022231276 A1 20220721; CN 113228342 A 20210806; EP 4050676 A1 20220831; EP 4050676 A4 20220907; JP 2023512358 A 20230327; WO 2022140982 A1 20220707
DOCDB simple family (application)
US 202217708277 A 20220330; CN 2020140378 W 20201228; CN 202080006949 A 20201228; EP 20938503 A 20201228; JP 2021533506 A 20201228