Global Patent Index - EP 4057016 A1

EP 4057016 A1 20220914 - METHOD FOR PREDICTING A REMAINING LIFETIME OF AN ELECTRICAL COMPONENT OF AN ELECTRICAL CIRCUIT

Title (en)

METHOD FOR PREDICTING A REMAINING LIFETIME OF AN ELECTRICAL COMPONENT OF AN ELECTRICAL CIRCUIT

Title (de)

VERFAHREN ZUR VORHERSAGE DER RESTLEBENSDAUER EINER ELEKTRISCHEN KOMPONENTE EINER ELEKTRISCHEN SCHALTUNG

Title (fr)

PROCÉDÉ DE PRÉDICTION DE LA DURÉE DE VIE RESTANTE D'UN COMPOSANT ÉLECTRIQUE D'UN CIRCUIT ÉLECTRIQUE

Publication

EP 4057016 A1 20220914 (EN)

Application

EP 21161923 A 20210311

Priority

EP 21161923 A 20210311

Abstract (en)

The present invention provides a method for predicting a remaining lifetime of an electrical component of an electrical circuit, the electrical circuit being part of a building management device. The method comprises: estimating (Si) two or more estimated temperatures of the electrical component by using a trained machine learning model of the electrical component that is trained based on training data. Further, the method comprises: generating (S2) a temporal course of temperature of the electrical component based on the two or more estimated temperatures; and computing (S<sub>3</sub>), based on the temporal course of temperature of the electrical component, an indicator for the remaining lifetime of the electrical component. The present invention also provides a method for predicting a remaining lifetime of an electrical circuit being part of a building management device.

IPC 8 full level

G01R 31/28 (2006.01); G01R 31/64 (2020.01); G05B 23/02 (2006.01)

CPC (source: EP US)

G01R 31/282 (2013.01 - US); G01R 31/2846 (2013.01 - US); G01R 31/2849 (2013.01 - US); G01R 31/2874 (2013.01 - EP); G01R 31/64 (2020.01 - EP US); G05B 23/0283 (2013.01 - EP); G05B 23/0254 (2013.01 - EP)

Citation (search report)

  • [I] EP 3745145 A1 20201202 - SCHNEIDER ELECTRIC IND SAS [FR]
  • [A] EP 3109648 A1 20161228 - MITSUBISHI ELECTRIC R&D CT EUROPE BV [NL], et al
  • [A] US 2018373234 A1 20181227 - KHALATE SUMANT S [IN], et al
  • [A] LIU HAO ET AL: "Prediction of Capacitor's Accelerated Aging Based on Advanced Measurements and Deep Neural Network Techniques", IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, IEEE SERVICE CENTER, PISCATAWAY, NJ, US, vol. 69, no. 11, 10 June 2020 (2020-06-10), pages 9019 - 9027, XP011813555, ISSN: 0018-9456, [retrieved on 20201008], DOI: 10.1109/TIM.2020.3001368

Designated contracting state (EPC)

AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

Designated extension state (EPC)

BA ME

DOCDB simple family (publication)

EP 4057016 A1 20220914; EP 4057016 B1 20240918; CN 116997805 A 20231103; EP 4305433 A1 20240117; US 2024159844 A1 20240516; WO 2022189613 A1 20220915

DOCDB simple family (application)

EP 21161923 A 20210311; CN 202280018646 A 20220311; EP 2022056300 W 20220311; EP 22712581 A 20220311; US 202218549401 A 20220311