EP 4129569 A1 20230208 - POLISHING TOOL, POLISHING SYSTEM AND METHOD OF POLISHING
Title (en)
POLISHING TOOL, POLISHING SYSTEM AND METHOD OF POLISHING
Title (de)
POLIERWERKZEUG, POLIERSYSTEM UND VERFAHREN ZUM POLIEREN
Title (fr)
OUTIL DE POLISSAGE, SYSTEME DE POLISSAGE ET PROCEDE DE POLISSAGE
Publication
Application
Priority
EP 21189546 A 20210804
Abstract (en)
The invention relates to a polishing tool (100) for polishing a spectacle lens (L) in a surface machining process, which comprises a tool body (110) for being rotatably supported about a rotational axis (RA1). The tool body (110) comprises a polishing surface (130) being outwardly exposed at a first axial end (101) of the tool body (110). Therein, the polishing surface (130) is axially bulged convexly or concavely with respect to the rotational axis (RA1) for polishing an optical surface (Li, L2) of the spectacle lens (L). The tool body (110) further comprises a channel (140) that extends axially through the tool body (110) from an inlet (142) to an outlet (141) to supply the polishing surface (130) with a polishing agent. The inlet (142) is provided at a second axial end (102) being opposite to the first axial end (101) with respect to the rotational axis (RA1). The outlet (141) is provided at the first axial end (101). The polishing surface (130) comprises at least one groove (150) that extends radially away from the outlet (141) to the perimeter of the polishing surface (130) to distribute the polishing agent across the polishing surface (130). The invention also relates to a system (200) and a method for polishing a spectacle lens (L) in a surface machining process with said polishing tool (100).
IPC 8 full level
B24B 13/01 (2006.01); B24B 1/00 (2006.01); B24B 57/02 (2006.01)
CPC (source: EP IL KR US)
B24B 13/0012 (2013.01 - KR US); B24B 13/012 (2013.01 - EP IL KR US); B24B 37/005 (2013.01 - US); B24B 57/02 (2013.01 - EP IL KR US)
Citation (search report)
- [XYI] EP 1652619 A2 20060503 - SCHNEIDER GMBH & CO KG [DE]
- [Y] CN 110732933 A 20200131 - INST OPTICS & ELECTRONICS CAS
- [A] WO 2021135452 A1 20210708 - UNIV TIANJIN [CN]
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
Designated validation state (EPC)
KH MA MD TN
DOCDB simple family (publication)
EP 4129569 A1 20230208; AU 2022323290 A1 20240201; CA 3226151 A1 20230209; CL 2024000255 A1 20240802; CN 118234596 A 20240621; IL 310593 A 20240401; JP 2024529532 A 20240806; KR 20240035829 A 20240318; MX 2024001089 A 20240227; US 2024342850 A1 20241017; WO 2023011979 A1 20230209
DOCDB simple family (application)
EP 21189546 A 20210804; AU 2022323290 A 20220726; CA 3226151 A 20220726; CL 2024000255 A 20240129; CN 202280052988 A 20220726; EP 2022070893 W 20220726; IL 31059324 A 20240201; JP 2024506635 A 20220726; KR 20247004471 A 20220726; MX 2024001089 A 20220726; US 202218294328 A 20220726