EP 4244635 A1 20230920 - PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND METALLIZED GUIDE HOLES
Title (en)
PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND METALLIZED GUIDE HOLES
Title (de)
TASTKOPF MIT VERBESSERTEM KONTAKT ZWISCHEN KONTAKTSONDEN UND METALLISIERTEN FÜHRUNGSLÖCHERN
Title (fr)
TÊTE DE SONDE À CONTACT AMÉLIORÉ ENTRE DES SONDES DE CONTACT ET DES TROUS MÉTALLISÉS DE GUIDAGE
Publication
Application
Priority
- IT 202000027149 A 20201112
- EP 2021081290 W 20211110
Abstract (en)
[origin: WO2022101295A1] It is herein disclosed a probe head (20) for testing the operation of a device under test, said probe head (20) comprising a plurality of contact probes (10) comprising a body (10') extending along a longitudinal axis (H-H) between respective end portions (10a, 10b) adapted to contact respective contact pads and having a substantially square or rectangular-shaped cross section, and at least one guide (40') lying in a plane (α) and provided with guide holes (40'h) for slidingly housing the contact probes (10), said guide holes (40'h) having a substantially square or rectangular-shaped cross section. Suitably, in the plane (α) of the guide (40'), the cross section of the guide holes (40'h) and the cross section of the contact probes (10) housed therein are rotated relative to each other around the longitudinal axis (H-H) and have respective different orientations with respect to a reference system (x-y) in said plane (α), so that at least one edge (S) of said body (10') is mechanically interfering with a corresponding wall (W) of said guide holes (40'h). Furthermore, the probe head (20) comprises a conductive portion (21) formed at the guide (40') and/or formed at another guide (40'') of the probe head (20) which another guide (40'') comprises respective guide holes (40''h), said conductive portion (21) including at least one group (40'h', 40''h') of guide holes (40'h, 40''h) and being adapted to contact and short-circuit a corresponding group of contact probes housed in said group (40'h', 40''h') of holes and adapted to carry a certain type of signal.
IPC 8 full level
G01R 1/073 (2006.01)
CPC (source: EP KR US)
G01R 1/07314 (2013.01 - KR US); G01R 1/07357 (2013.01 - EP KR US); G01R 1/07371 (2013.01 - EP KR); G01R 31/2831 (2013.01 - KR)
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
Designated validation state (EPC)
KH MA MD TN
DOCDB simple family (publication)
WO 2022101295 A1 20220519; CN 116547541 A 20230804; EP 4244635 A1 20230920; IT 202000027149 A1 20220512; JP 2023549202 A 20231122; KR 20230104917 A 20230711; TW 202223419 A 20220616; US 2024012027 A1 20240111
DOCDB simple family (application)
EP 2021081290 W 20211110; CN 202180076227 A 20211110; EP 21801147 A 20211110; IT 202000027149 A 20201112; JP 2023528335 A 20211110; KR 20237019071 A 20211110; TW 110141507 A 20211108; US 202118252142 A 20211110