(19)
(11)EP 2 980 840 B1

(12)EUROPEAN PATENT SPECIFICATION

(45)Mention of the grant of the patent:
04.11.2020 Bulletin 2020/45

(21)Application number: 14776367.6

(22)Date of filing:  18.03.2014
(51)International Patent Classification (IPC): 
G01R 31/28(2006.01)
G01R 1/18(2006.01)
H01L 21/66(2006.01)
(86)International application number:
PCT/JP2014/058149
(87)International publication number:
WO 2014/157120 (02.10.2014 Gazette  2014/40)

(54)

PROBE DEVICE

SONDENVORRICHTUNG

DISPOSITIF DE SONDE


(84)Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

(30)Priority: 27.03.2013 JP 2013065510

(43)Date of publication of application:
03.02.2016 Bulletin 2016/05

(73)Proprietor: Tokyo Electron Limited
Tokyo 107-6325 (JP)

(72)Inventor:
  • HATTA Masataka
    Nirasaki-shi, Yamanashi 407-8511 (JP)

(74)Representative: Hoffmann Eitle 
Patent- und Rechtsanwälte PartmbB Arabellastraße 30
81925 München
81925 München (DE)


(56)References cited: : 
WO-A2-02/09155
WO-A2-2011/082183
JP-A- 2007 042 704
JP-B2- H0 762 691
WO-A2-99/34412
JP-A- 2005 286 107
JP-A- 2012 175 046
US-A- 5 610 529
  
      
    Note: Within nine months from the publication of the mention of the grant of the European patent, any person may give notice to the European Patent Office of opposition to the European patent granted. Notice of opposition shall be filed in a written reasoned statement. It shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).


    Description

    Field of the Invention



    [0001] The present invention relates to a probe device.

    Background of the Invention



    [0002] In a manufacturing process of a semiconductor device, a probe device is used to perform an electrical test of a semiconductor device formed on a semiconductor wafer. The probe device drives a mounting table on which the semiconductor wafer is mounted and makes a probe contact with an electrode of the semiconductor device formed on the semiconductor wafer to thereby obtain electrical conduction. The test of the semiconductor device is performed by detecting an output signal from the semiconductor device to which a predetermined test signal has been applied from a measuring device (tester) through the probe.

    [0003] A probe device for measuring a minute current and a minute voltage from the semiconductor device employs, as a mounting table on which the semiconductor wafer is mounted, a mounting table including an insulating layer, a first conductive layer fixed to one side of the insulating layer, and a second conductive layer fixed to the other side of the insulating layer (see, e.g., Japanese Patent No. 3351956).

    [0004] However, when the above-mentioned mounting table is used in a wide temperature range (e.g., a temperature range equal to or higher than 300°C), the mounting table may be warped due to difference in thermal expansion coefficients of the insulating layer and the conductive layers, thereby making it difficult to bring the probe into accurate contact with an electrode of the semiconductor device. Further, due to the difference in thermal expansion coefficients of the insulating layer and the conductive layers, the conductive layers may be detached from the insulating layer and thus the mounting table may be damaged. Furthermore, due to the difference in thermal expansion coefficients of the insulating layer and the conductive layers, stress may be applied to the insulating layer to have a crack in the insulating layer and thus the mounting table may be damaged. Further, WO 02/09155 A2 discloses a workpiece chuck used, for example, to support a semiconductor wafer during processing. In one aspect, the chuck includes a thermal plate assembly which includes both heating and cooling capability. The heating element can be a resistive heater in a coiled configuration disposed in a plane. The cooling can be performed via a cooling fluid circulated through cooling tubes which are also disposed in a coiled configuration in a plane. The plane of the heating element and the cooling tubes can be the same plane, and that plane can be a center plane of the thermal plate assembly. By locating the heating and cooling in the same plane, uniform heating and cooling are achieved. Also, by locating the heating element and cooling tubes in the center of the thermal plate, distortions such as doming and dishing in the thermal plate are eliminated such that the wafer can be held extremely flat on the chuck. The heating element and cooling tubes are coiled in an interleaved fashion to provide uniform heating and cooling while allowing them to simultaneously occupy the same plane. The thermal plate assembly can include a housing made of a cast material such as aluminum.

    [0005] Finally, WO 99/34412 A2 discloses a workpiece chuck that includes an upper assembly on which can be mounted a flat workpiece such as a semiconductor wafer. A lower assembly is mountable to a base that supports the chuck. A non-constraining attachment means such as vacuum, springs or resilient washers applied to the chuck holds the upper assembly to the lower assembly, the lower assembly to the base and can hold the wafer to the top surface of the upper assembly. A heater and a heat sink can be included in the bottom assembly to allow for temperature cycle testing of the wafer. By holding the chuck together by non-constraining means, the chuck layers can move continuously relative to each other under expansion forces caused by temperature effects. Mechanical stresses on the chuck and resulting deformation of the chuck and workpiece over temperature are substantially eliminated.

    Summary of the Invention



    [0006] In view of the above, the present invention provides a probe device capable of performing an accurate test without causing warpage or damage of a mounting table.

    [0007] In accordance with an aspect, there is provided a probe device according to claim 1.

    Effect of the Invention



    [0008] In accordance with the present invention, an accurate test can be performed without generating a twist and damage in a mounting table.

    Brief Description of the Drawings



    [0009] 

    Fig. 1 is a plan view schematically showing an entire configuration of a probe device in accordance with an embodiment of the present invention.

    Fig. 2 is a view schematically showing a configuration of a mounting table in the probe device of Fig. 1.

    Fig. 3 is a plan view schematically showing an insulating plate and a guard electrode of Fig. 2.

    Fig. 4A is a horizontal cross-sectional view of a circular hole shown in Fig. 3.

    Fig. 4B is a vertical cross-sectional view of the vicinity of the circular hole shown in Fig. 3.

    Fig. 5A is a horizontal cross-sectional view of an oblong hole shown in Fig. 3.

    Fig. 5B is a vertical cross-sectional view of the vicinity of the oblong hole shown in Fig. 3.


    Detailed Description of the Embodiments



    [0010] Hereinafter, embodiments of the present invention will be described in detail with respect to the accompanying drawings.

    [0011] Fig. 1 is a plan view schematically showing an entire configuration of a probe device 100 in accordance with an embodiment of the present invention. The probe device 100 of Fig. 1 includes a measuring unit 110 and a loader unit 150 serving as a transfer unit. The measuring unit 110 is movable in x-y-z-θ directions, and includes a circular disk-shaped mounting table 111 on which a semiconductor wafer W is mounted. By driving the mounting table 111 by a driving mechanism 112, the measuring unit 110 makes probes 210 (see Fig. 2) provided at a probe card and electrodes of semiconductor devices formed on the semiconductor wafer W contact with each other to measure electrical characteristics of the semiconductor devices.

    [0012] The loader unit 150 includes a load port 152 on which a wafer carrier (wafer cassette or FOUP) 151, which accommodates the semiconductor wafer W, is mounted at the front side of the loader unit 150 (lower side in Fig. 1), and a wafer transfer mechanism 160 adjacent to the load port 152. The loader unit 150 further includes a position alignment mechanism 170 at the rear side thereof (upper side in Fig. 1). The position alignment mechanism 170 detects a position of a notch of the semiconductor wafer W and an eccentricity state of the semiconductor wafer W by rotating the semiconductor wafer W.

    [0013] The wafer transfer mechanism 160 includes a wafer transfer arm 161 for vacuum-suctioning and transferring the semiconductor wafer W. The wafer transfer arm 161 includes a plurality of (two in this embodiment) suction portions (suction pad) 162 for suctioning and holding the semiconductor wafer W. A vacuum line (not shown) connected to a suction source such as a vacuum pump is connected to the attracting portions 162. The wafer transfer arm 161 may be, if necessary, provided in plural number in a vertically overlapped state.

    [0014] The wafer transfer mechanism 160 transfers the semiconductor wafer W between the wafer carrier 151 mounted on the load port 152, the position alignment mechanism 170, and the mounting table 111 of the measuring unit 110 by extending, retracting and rotating the wafer transfer arm 161.

    [0015] The load port 152 is movable up and down by a vertical driving mechanism (not shown). A support frame 153 is provided between the load port 152 and the wafer transfer mechanism 160. The load port 152 includes an optical detector (not shown). When the wafer carrier 151 mounted on the load port 152 is moved up and down, the optical detector detects presence or absence of the semiconductor wafer W and a slot in the wafer carrier 151 which receives the semiconductor wafer W is accommodated.

    [0016] Fig. 2 is a view showing a schematic configuration of the mounting table 111 in the probe device 100 of Fig. 1.

    [0017] The mounting table 111 of Fig. 2 includes a temperature control mechanism 113 and a mounting part 114 at the top of the temperature control mechanism 113. The temperature control mechanism 113 controls a temperature of the semiconductor wafer W mounted on the mounting table 111 in a predetermined temperature range, e.g., in a range of 300°C or above (in this embodiment, a range from -60°C to +400°C).

    [0018] The mounting part 114 has a three-layer structure formed of three plate bodies, i.e., a force electrode 115, an insulating plate 116, and a guard electrode 117 sequentially laminated from the side of the semiconductor wafer W mounted on the mounting part 114. The insulating plate 116 is interposed between the force electrode 115 and the guard electrode 117. The structure of the mounting part 114 is not limited to three-layer and may be multi-layer such as four-layer, five-layer or the like.

    [0019] In the present embodiment, the force electrode 115 is connected to a force terminal of a measuring device 200 through a coaxial cable 201. The guard electrode 117 is connected to a guard terminal of the measuring device 200 through an outer conductor of the coaxial cable 201. A probe 210 contacting with an electrode of the semiconductor device formed on the semiconductor wafer W is connected to the force terminal of the measuring device 200 through an inner conductor of a coaxial cable 211, and also connected to the guard terminal of the measuring device 200 through an outer conductor of the coaxial cable 211. Although only one probe 210 is shown in Fig. 2, a plurality of probes 210 may be used.

    [0020] The force electrode 115 and the guard electrode 117 are each connected to the measuring device 200 in the same potential as the measuring device 200 and in low impedance. The guard electrode 117 reduces a leaking current flowing through the insulating plate 116 from the force electrode 115 and shields electrical noises intruding from the lower side of the guard electrode 117. Therefore, it is possible to accurately measure a minute current and a minute voltage of the semiconductor device formed on the semiconductor wafer W.

    [0021] As a material of the force electrode 115 and the guard electrode 117, a conductive metal, e.g., copper, iron, nickel, silver, gold, aluminum, stainless steel or the like may be used. As a material of the insulating plate 116, an insulating material, e.g., alumina ceramic, boron nitride, quartz, Teflon™, or the like may be used.

    [0022] The insulating plate 116 and the guard electrode 117 have a disk shape, and a circular hole 120 that is a circular through hole is formed at the center thereof (see Fig. 3). Around the circular hole 120, a plurality of (six in this embodiment) oblong holes (through holes) 121 is formed to extend in a diametric direction of the mounting table 111 (the insulating plate 116 and the guard electrode 117) (hereinafter, referred to as "diametric direction"). The insulating plate 116 and the guard electrode 117 may have at least one oblong hole 121. In a case of having a plurality of oblong holes 121, as shown in Fig. 3, the oblong holes 121 may be provided at regular intervals (60° interval in Fig. 3) along the circumferential direction of the mounting table 111 (the insulating plate 116 and the guard electrode 117).

    [0023] Fig. 4A is a horizontal cross-sectional view of the circular hole 120 shown in Fig. 3, and Fig. 4B is a vertical cross-sectional view of the vicinity of the circular hole 120 shown in Fig. 3. Fig. 5A is a horizontal cross-sectional view of the oblong hole 121 shown in Fig. 3, and Fig. 5B is a vertical cross-sectional view of the vicinity of the oblong hole 121 shown in Fig. 3. Figs. 4B and 5B respectively show that parts of the force electrode 115 corresponding to the circular hole 120 and the oblong hole 121 are non-through holes and the force electrode 115 has screw holes 122, into which respective male screws can be screwed, at inner circumferential surfaces of the non-through holes.

    [0024] A cylindrical collar 130 is fitted into the circular hole 120 (fixing part) of Fig. 4A. The collar 130 is made of an insulating material, e.g., alumina ceramic, mica-ceramic (Micarex or the like) or the like. A flange portion 131 is formed at one end of a cylindrical member of the collar 130. A through hole 132, into which a male screw 140 is inserted, is formed along a central axis of the collar 130. The male screw 140 is made of, e.g., an insulating material.

    [0025] The force electrode 115, the insulating plate 116 and the guard electrode 117 are sequentially laminated. Then, the collar 130 is inserted into the circular hole 120 from the side of the guard electrode 117, and the male screw 140 is inserted into the through hole 132 of the collar 130 through a washer 133 to be screwed to the screw hole 122.

    [0026] A length (L1 in Fig. 4B) of the collar 130 except the flange portion 131 is set to be smaller than a sum (L2 in Fig. 4B) of a thickness of the insulating plate 116 and a thickness of the guard electrode 117. By doing so, when the male screw 140 is screwed, the guard electrode 117 and the insulating plate 116 are pressed against the force electrode 115 by the flange portion 131, and the force electrode 115, the insulating plate 116 and the guard electrode 117 are fixed to each other. An outer diameter of the circular hole 120 is preferably set to, e.g., about 1 mm to 20 mm (6 mm in this embodiment). Further, an outer diameter of the collar 130 (outer diameter of the part of the collar 130 except the flange portion 131) is preferably set to, e.g., about 1 mm to 20 mm (6 mm in this embodiment).

    [0027] In Figs. 5A and 5B, a cylindrical collar 135 is fitted into the oblong hole 121 (locking part) formed around the circular hole 120. The collar 135 is made of an insulating material, e.g., alumina ceramic, mica-ceramic (Micarex or the like) or the like. A flange portion 136 is formed at one end of the collar 135. A through hole 137, into which the male screw 140 is inserted, is formed along a central axis of the collar 135.

    [0028] The force electrode 115, the insulating plate 116 and the guard electrode 117 are sequentially laminated. Then, the collar 135 is inserted into the oblong hole 121 from the side of the guard electrode 117, and the male screw is inserted into the through hole 137 of the collar 135 through a washer 133 to be screwed to the screw hole 122.

    [0029] A length (L3 in Fig. 5B) of the collar 135 except the flange portion 136 is set to be larger than the sum (L2 in Fig. 5B) of the thickness of the insulating plate 116 and the thickness of the guard electrode 117. By doing so, when the male screw 140 is screwed, a gap "d" is formed between a bottom surface of the guard electrode 117 and a top surface of the flange portion 136, so that the insulating plate 116 and the guard electrode 117 are not fixed to the force electrode 115 and can be moved in the diametric direction.

    [0030] That is to say, the force electrode 115, the insulating plate 116 and the guard electrode 117 are respectively movable in the diametric direction along the oblong hole 121 but are not movable in the circumferential direction. Accordinlgy, even when the force electrode 115, the insulating plate 116 and the guard electrode 117 are different in their thermal expansion coefficients from each other so that extension/contraction amounts of the the force electrode 115, the insulating plate 116 and the guard electrode 117 in the diametric direction are different from each other, stress is not applied to each of the force electrode 115, the insulating plate 116 and the guard electrode 117.

    [0031] A size in a cross-section shape of the oblong hole 121 is preferably set to, e.g., about 1 mm to 20 mm (10 mm in this embodiment) in a longer side, and to, e.g., about 1 mm to 20 mm (6 mm in this embodiment) in a shorter side. An outer diameter of the collar 135 (outer diameter of the part of the collar 130 except the flange portion 131) is preferably set to, e.g., about 1 mm to 20 mm (6 mm in this embodiment).

    [0032] The gap "d" formed between the bottom surface of the guard electrode 117 and the top surface of the flange portion 136 is preferably set to, e.g., about 0.01 mm to 0.5 mm. By doing so, the force electrode 115, the insulating plate 116 and the guard electrode 117 are not pressed by each other in the thickness direction and can be individually moved in the diametric direction.

    [0033] In the probe device having the above configuration, the mounting part 114 of the mounting table 111 has a three-layer structure in which the force electrode 115, the insulating plate 116 and the guard electrode 117 are laminated. However, the three plate bodies are fixed at the circular hole 120 provided at the center thereof, and are locked to be movable in the diametric direction at the oblong hole 121 provided at the outer side in the diametric direction.

    [0034] Accordingly, even in a case where a temperature is controlled in a wide temperature range (from -60°C to +400°C in this embodiment) by the temperature control mechanism 113, the force electrode 115, the insulating plate 116 and the guard electrode 117 are respectively moved in the diametric direction. Therefore, it is possible to suppress the stress due to difference in the extension/contraction amounts, which is caused from difference in the thermal expansion coefficients of the the force electrode 115, the insulating plate 116 and the guard electrode 117.

    [0035] Specifically, it is possible to prevent a warpage of the mounting part 114 which would lead to an inaccurate contact of the probe 210 with the electrode of the semiconductor device formed on the semiconductor wafer W, so that a test of the semiconductor device can be performed more precisely. Further, it is possible to prevent damage of the mounting table 111 such as detachment of the force electrode 115 and the guard electrode 117 from the insulating plate 116, cracks in the insulating plate 116, and the like.

    [0036] Next, a test sequence of the semiconductor wafer W by the probe device 100 having the above configuration will be described.

    [0037] First, when the wafer carrier 151 in which the semiconductor wafer W is accommodated is mounted on the load port 152 of the loader unit 150, the vertical driving mechanism moves the wafer carrier 151 and the load port 152 up and down. The optical detector detects a slot in the wafer carrier 151 in which the semiconductor wafer W is accommodated.

    [0038] The wafer transfer arm 161 of the wafer transfer mechanism 160 holds the semiconductor wafer W and transfers the semiconductor wafer W to the position alignment mechanism 170. The position alignment mechanism 170 detects a notch of the semiconductor wafer W to find a position of the semiconductor wafer W.

    [0039] After completing the position detection by the position alignment mechanism 170, the wafer transfer arm 161 of the wafer transfer mechanism 160 receives the semiconductor wafer W from the position alignment mechanism 170 and mounts the semiconductor wafer W on the mounting table 111 of the measuring unit 110.

    [0040] When the probe 210 is made to contact with the semiconductor device of the semiconductor wafer W on the mounting table 111, an electrical conduction is obtained (see Fig. 2). A test signal is supplied to the semiconductor device from the measuring device and an output signal from the semiconductor device is measured to thereby test electrical characteristics of the semiconductor device.

    [0041] After completing the test on the electrical characteristics of the semiconductor device of the semiconductor wafer W, the wafer transfer arm 161 of the wafer transfer mechanism 160 receives the semiconductor wafer W on the mounting table 111 and accommodates the semiconductor wafer W in the wafer carrier 151. Then, the test of the semiconductor wafer W is completed.

    [0042] As described above, the present invention has been described with respect to the above embodiment. However, the present invention is not limited to the above embodiment.

    Description of Reference Numerals



    [0043] 
    100
    probe device
    110
    measuring unit
    111
    mounting table
    150
    loader unit
    151
    wafer carrier
    152
    load port
    153
    support frame
    160
    wafer transfer mechanism
    161
    wafer transfer arm
    162
    suction portion
    170
    position alignment mechanism



    Claims

    1. A probe device (100) for performing an electrical test of a semiconductor device formed on a semiconductor wafer (W), the probe device (100) comprising:

    a mounting table (111) on which the semiconductor wafer (W) is mounted;

    a driving mechanism (112) configured to bring a probe (210) into contact with an electrode of the semiconductor device mounted on the mounting table (111); and

    a temperature control mechanism (113) configured to control a temperature of the mounting table (111),

    wherein the mounting table (111) includes a disk-shaped first electrode (115), a disk-shaped second electrode (117), and a disk-shaped insulating plate (116) interposed between the first electrode (115) and the second electrode (117), and

    the first electrode (115), the second electrode (117) and the insulating plate (116) are fixed to each other at a fixing part provided at their respective centers, and

    characterised in that

    the first electrode (115), the second electrode (117) and the insulating plate (116) are locked to be movable relative to each other in a diametric direction at a locking part provided at an outer side of the fixing part in the diametric direction with a gap therebetween,

    in the locking part, a screw hole (122) is formed in the first electrode (115) and an oblong hole (121) penetrating through the insulating plate (116) and the second electrode (117) in their thickness direction is formed at a position of the insulating plate (116) and the second electrode (117) corresponding to the screw hole (122),

    the first electrode (115), the insulating plate (116) and the second electrode (117) are stacked in that order and a male screw (140), which is inserted from a side of the second electrode (117), is screwed to the screw hole (122),

    in the fixing part, another screw hole (122) is formed in the first electrode (115) and a circular hole (120) penetrating through the insulating plate (116) and the second electrode (117) in their thickness direction is formed at a position of the insulating plate (116) and the second electrode (117) corresponding to the another screw hole (122), and

    collars (130, 135) each having a cylindrical member and a flange portion (131, 136) at one end of the cylindrical member are respectively fitted into the circular hole (120) of the fixing part and the oblong hole (121) of the locking part, and a through hole (132, 137), into which the male screw (140) is inserted, is formed in each of the collars (130, 135) along a central axis of the cylindrical member.


     
    2. The probe device (100) of claim 1, wherein the locking part is provided in plural number at intervals along a circumferential direction of the mounting table (111).
     
    3. The probe device (100) of claim 1 or 2, wherein a horizontal cross-sectional shape of the oblong hole (121) extends in the diametric direction.
     
    4. The probe device (100) of any one of claims 1 to 3, wherein the male screw (140) is made of an insulating material.
     
    5. The probe device (100) of any one of claims 1 to 4, wherein in the fixing part, a length of the collar (130) except the flange portion (131) is set to be smaller than a sum of a thickness of the insulating plate (116) and a thickness of the second electrode (117).
     
    6. The probe device (100) of any one of claims 1 to 4, wherein in the locking part, a length of the collar (135) except the flange portion (136) is set to be larger than a sum of a thickness of the insulating plate (116) and a thickness of the second electrode (117).
     
    7. The probe device (100) of any one of claims 1 to 6, wherein the collars (130, 135) are made of an insulating material.
     
    8. The probe device (100) of any one of claims 1 to 7, wherein the first electrode (115) is a force electrode and the second electrode (117) is a guard electrode.
     


    Ansprüche

    1. Sondenvorrichtung (100) zum Durchführen eines elektrischen Tests einer Halbleitervorrichtung, die auf einem Halbleiterwafer (W) gebildet ist, wobei die Sondenvorrichtung (100) umfasst:

    einen Montagesockel (111), auf dem der Halbleiterwafer (W) montiert ist;

    einen Antriebsmechanismus (112), der konfiguriert ist, eine Sonde (210) mit einer Elektrode der Halbleitervorrichtung, die auf dem Montagesockel (111) montiert ist, in Kontakt zu bringen; und

    einen Temperaturregelungsmechanismus (113), der dazu ausgelegt ist, eine Temperatur des Montagesockels (111) zu regeln,

    wobei der Montagesockel (111) eine scheibenförmige erste Elektrode (115), eine scheibenförmige zweite Elektrode (117) und eine scheibenförmige Isolierplatte (116) zwischen der ersten Elektrode (115) und der zweiten Elektrode (117) eingesetzt umfasst, und

    die erste Elektrode (115), die zweite Elektrode (117) und die Isolierplatte (116) bei einem Fixierteil, das an deren jeweiligen Mittelpunkten bereitgestellt ist, aneinander fixiert sind, und

    dadurch gekennzeichnet, dass

    die erste Elektrode (115), die zweite Elektrode (117) und die Isolierplatte (116) so verriegelt sind, dass sie in einer Durchmesserrichtung bei einem Verriegelungsteil, das an einer Außenseite des Fixierteils in der Durchmesserrichtung mit einem Spalt dazwischen bereitgestellt ist, relativ zueinander beweglich sind,

    in dem Verriegelungsteil ein Schraubloch (122) in der ersten Elektrode (115) gebildet ist, und ein Längsloch (121), das durch die Isolierplatte (116) und die zweite Elektrode (117) in deren Dickenrichtung dringt, an einer Position der Isolierplatte (116) und der zweiten Elektrode (117) entsprechend dem Schraubloch (122) gebildet ist,

    die erste Elektrode (115), die Isolierplatte (116) und die zweite Elektrode (117) in dieser Reihenfolge gestapelt sind und eine Schraube mit Außengewinde (140), die von einer Seite der zweiten Elektrode (117) eingesetzt ist, an das Schraubloch (122) geschraubt wird,

    in dem Fixierteil ein anderes Schraubloch (122) in der ersten Elektrode (115) gebildet ist, und ein rundes Loch (120), das durch die Isolierplatte (116) und die zweite Elektrode (117) in deren Dickenrichtung dringt, an einer Position der Isolierplatte (116) und der zweiten Elektrode (117) entsprechend dem anderen Schraubloch (122) gebildet ist, und

    Manschetten (130, 135), die jeweils ein zylinderförmiges Bauteil und einen Flanschabschnitt (131, 136) an einem Ende des zylinderförmigen Bauteils aufweisen, jeweils in das runde Loch (120) des Fixierteils und das Längsloch (121) des Verriegelungsteils eingesetzt sind und ein Durchgangsloch (132, 137), in das die Schraube mit Außengewinde (140) eingesetzt ist, in jedem der Manschetten (130, 135) entlang einer Mittelachse des zylinderförmigen Bauteils gebildet ist.


     
    2. Sondenvorrichtung (100) nach Anspruch 1, wobei das Verriegelungsteil mehrmals bei Abständen entlang einer Umfangsrichtung des Montagesockels (111) bereitgestellt ist.
     
    3. Sondenvorrichtung (100) nach Anspruch 1 oder 2, wobei sich eine horizontale Querschnittsform des Längslochs (121) in der Durchmesserrichtung erstreckt.
     
    4. Sondenvorrichtung (100) nach einem der Ansprüche 1 bis 3, wobei die Schraube mit Außengewinde (140) aus einem isolierenden Material hergestellt ist.
     
    5. Sondenvorrichtung (100) nach einem der Ansprüche 1 bis 4, wobei in dem Fixierteil eine Länge der Manschette (130) außer dem Flanschabschnitt (131) eingerichtet ist, kleiner als eine Summe einer Dicke der Isolierplatte (116) und einer Dicke der zweiten Elektrode (117) zu sein.
     
    6. Sondenvorrichtung (100) nach einem der Ansprüche 1 bis 4, wobei in dem Verriegelungsteil eine Länge der Manschette (135) außer dem Flanschabschnitt (136) eingerichtet ist, größer als eine Summe einer Dicke der Isolierplatte (116) und einer Dicke der zweiten Elektrode (117) zu sein.
     
    7. Sondenvorrichtung (100) nach einem der Ansprüche 1 bis 6, wobei die Manschetten (130, 135) aus einem isolierenden Material hergestellt sind.
     
    8. Sondenvorrichtung (100) nach einem der Ansprüche 1 bis 7, wobei die erste Elektrode (115) eine Kraftelektrode ist und die zweite Elektrode (117) eine Schutzelektrode ist.
     


    Revendications

    1. Dispositif de sonde (100) pour effectuer un test électrique d'un dispositif semi-conducteur formé sur une tranche de semi-conducteur (W), le dispositif de sonde (100) comprenant :

    une table de montage (111) sur laquelle la tranche de semi-conducteur (W) est montée ;

    un mécanisme d'entraînement (112) configuré pour amener une sonde (210) en contact avec une électrode du dispositif semi-conducteur monté sur la table de montage (111) ; et

    un mécanisme de commande de température (113) configuré pour commander une température de la table de montage (111),

    dans lequel la table de montage (111) inclut une première électrode en forme de disque (115), une seconde électrode en forme de disque (117), et une plaque isolante en forme de disque (116) interposée entre la première électrode (115) et la seconde électrode (117), et

    la première électrode (115), la seconde électrode (117) et la plaque isolante (116) sont fixées les unes aux autres au niveau d'une partie de fixation fournie au niveau de leur centre respectif, et

    caractérisé en ce que

    la première électrode (115), la seconde électrode (117) et la plaque isolante (116) sont verrouillées pour être mobiles les unes par rapport aux autres dans une direction diamétrale au niveau d'une partie de verrouillage fournie au niveau d'un côté extérieur de la partie de fixation dans la direction diamétrale avec un écart entre celles-ci,

    dans la partie de verrouillage, un trou de vis (122) est formé dans la première électrode (115) et un trou oblong (121) pénétrant dans la plaque isolante (116) et dans la seconde électrode (117) dans leur direction d'épaisseur est formé au niveau d'une position de la plaque isolante (116) et de la seconde électrode (117) correspondant au trou de vis (122),

    la première électrode (115), la plaque isolante (116) et la seconde électrode (117) sont empilées dans cet ordre et une vis mâle (140), qui est insérée à partir d'un côté de la seconde électrode (117), est vissée dans le trou de vis (122),

    dans la partie de fixation, un autre trou de vis (122) est formé dans la première électrode (115) et un trou circulaire (120) pénétrant dans la plaque isolante (116) et dans la seconde électrode (117) dans leur direction d'épaisseur est formé au niveau d'une position de la plaque isolante (116) et de la seconde électrode (117) correspondant à l'autre trou de vis (122), et

    des colliers (130, 135) présentant chacun un élément cylindrique et une partie de bride (131, 136) au niveau d'une extrémité de l'élément cylindrique sont respectivement logés dans le trou circulaire (120) de la partie de fixation et dans le trou oblong (121) de la partie de verrouillage, et un trou traversant (132, 137), dans lequel la vis mâle (140) est insérée, est formé dans chacun des colliers (130, 135) le long d'un axe central de l'élément cylindrique.


     
    2. Dispositif de sonde (100) selon la revendication 1, dans lequel la partie de verrouillage est fournie en nombre pluriel à des intervalles le long d'une direction circonférentielle de la table de montage (111).
     
    3. Dispositif de sonde (100) selon la revendication 1 ou 2, dans lequel une forme de section transversale horizontale du trou oblong (121) s'étend dans la direction diamétrale.
     
    4. Dispositif de sonde (100) selon l'une quelconque des revendications 1 à 3, dans lequel la vis mâle (140) est faite d'un matériau isolant.
     
    5. Dispositif de sonde (100) selon l'une quelconque des revendications 1 à 4, dans lequel, dans la partie de fixation, une longueur du collier (130) à l'exception de la partie de bride (131) est définie comme étant plus petite qu'une somme d'une épaisseur de la plaque isolante (116) et d'une épaisseur de la seconde électrode (117).
     
    6. Dispositif de sonde (100) selon l'une quelconque des revendications 1 à 4, dans lequel, dans la partie de verrouillage, une longueur du collier (135) à l'exception de la partie de bride (136) est définie comme étant plus grande qu'une somme d'une épaisseur de la plaque isolante (116) et d'une épaisseur de la seconde électrode (117).
     
    7. Dispositif de sonde (100) selon l'une quelconque des revendications 1 à 6, dans lequel les colliers (130, 135) sont faits d'un matériau isolant.
     
    8. Dispositif de sonde (100) selon l'une quelconque des revendications 1 à 7, dans lequel la première électrode (115) est une électrode de force et la seconde électrode (117) est une électrode de garde.
     




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    Cited references

    REFERENCES CITED IN THE DESCRIPTION



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    Patent documents cited in the description