(19)
(11)EP 3 964 838 A3

(12)EUROPEAN PATENT APPLICATION

(88)Date of publication A3:
27.07.2022 Bulletin 2022/30

(43)Date of publication A2:
09.03.2022 Bulletin 2022/10

(21)Application number: 21192344.6

(22)Date of filing:  20.08.2021
(51)International Patent Classification (IPC): 
G01N 35/00(2006.01)
G01N 21/82(2006.01)
G01N 21/27(2006.01)
(52)Cooperative Patent Classification (CPC):
G01N 35/00693; G01N 21/274; G01N 21/82; G01N 2201/122; G01N 2035/0091
(84)Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA ME
Designated Validation States:
KH MA MD TN

(30)Priority: 31.08.2020 JP 2020146069

(71)Applicant: SYSMEX CORPORATION
Kobe-shi Hyogo 651-0073 (JP)

(72)Inventors:
  • Kato, Akihito
    Kobe-shi, Hyogo, 651-0073 (JP)
  • Kurono, Hiroshi
    Kobe-shi, Hyogo, 651-0073 (JP)

(74)Representative: Hoffmann Eitle 
Patent- und Rechtsanwälte PartmbB Arabellastraße 30
81925 München
81925 München (DE)

  


(54)CALIBRATION CURVE SETTING METHOD, SPECIMEN ANALYSIS METHOD, CALIBRATION CURVE SETTING PROGRAM, SPECIMEN ANALYSIS PROGRAM, AND SPECIMEN ANALYZER


(57) Disclosed is a calibration curve setting method for setting a calibration curve, the calibration curve setting method including: creating a first calibration curve on the basis of a measurement value obtained by measuring a standard sample for which a concentration of a predetermined component is known; creating a second calibration curve by correcting the created first calibration curve; displaying a screen configured to support an operator for restoring the second calibration curve to the first calibration curve; receiving an instruction of restoring the second calibration curve to the first calibration curve; and displaying the first calibration curve upon receiving the instruction of restoring.







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