Description  Claims  Drawing  Cited references 

JP2005347494A   [0007]  [0015] 
JP2005311072A   [0007]  [0015] 
JP2007067454A   [0007]  [0015] 
US7208393B   [0015]  [0015] 
US2007184637A1   [0016] 
EP1710841A2   [0017] 

Abstract Book of the 66th Academic Lecture Meeting of the Japan Society of Applied Physics   [0013]  [0015] 
Appl. Phys. Lett.   [0014]  [0015] 
Applications Environmental Impact and Microstructure of Light-Emitting Diodes   [0015] 
High-resolution Z-contrast Imaging by the HAADF-STEM Method   [0015] 
Imaging in High Resolution HAADF-STEM   [0015]  [0351] 
Material Transactions   [0015] 
Applications Environmental Impact and Microstructure of Light-Emitting Diodes   [0349] 
High-resolution Z-contact Imaging by the HAADF-STEM Method   [0351]