Description  Claims  Drawing  Cited references 

JP2008098674A   [0010] 
JPHEI54812B   [0010] 
EP0565054A2   [0010] 

Temperature Dependence of Electron Mobility in InGaAs/InAlAs Heterostructures   [0010] 
Kink Effect in an InAs-Inserted-Channel InAlAs/InGaAs Inverted HEMT at Low Temperature   [0010] 
ELECTRICAL CHARACTERIZATION AND ALLOY SCATTERING MEASUREMENTS OF LPE GaxIn1-xAs/InP FOR HIGH FREQUENCY DEVICE APPLICATIONS   [0010]