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2010-12-08T03:44:42+01:00
2010-10-31T11:05:42Z
2010-12-08T03:44:42+01:00
Jouve S.A., EPO - Publication - KB, TaggedPDF v1.27
EP-0216276-A3-19890322
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EP-0216276-A3-19890322
The tester for logic circuits provided with fast-recovery power supply for supplying high current to a logic circuit under test and for measuring a low current of the circuit under test comprises first and second differential amplifiers (21,22) coupled to the CMOS circuit (10) being tested and having dual feedback loops with one loop controlling the resistance of the other loop. The first amplifier (21) is coupled between a reference voltage (25) and a capacitor (35) supplying current to the CMOS circuit (10) under test. The second amplifier (22) is coupled between the same reference voltage (25) and the output (32) of the first amplifier (21). Resistive feedback means (33) are coupled between the circuit (10) under test and the output (32) of the first amplifier (21), and an a.c.-coupled impedance switching means 140) is coupled between the output (37) of the second amplifier (22) and across the resistive feedback means (33), whereby the impedance switching means (40) can alter the impedance of the resistive feedback means (33) by shunting the latter to recharge the capacitor (35) supplying current to the circuit (10) under test.
The tester for logic circuits provided with fast-recovery power supply for supplying high current to a logic circuit under test and for measuring a low current of the circuit under test comprises first and second differential amplifiers (21,22) coupled to the CMOS circuit (10) being tested and having dual feedback loops with one loop controlling the resistance of the other loop. The first amplifier (21) is coupled between a reference voltage (25) and a capacitor (35) supplying current to the CMOS circuit (10) under test. The second amplifier (22) is coupled between the same reference voltage (25) and the output (32) of the first amplifier (21). Resistive feedback means (33) are coupled between the circuit (10) under test and the output (32) of the first amplifier (21), and an a.c.-coupled impedance switching means 140) is coupled between the output (37) of the second amplifier (22) and across the resistive feedback means (33), whereby the impedance switching means (40) can alter the impedance of the resistive feedback means (33) by shunting the latter to recharge the capacitor (35) supplying current to the circuit (10) under test.
en
European Patent Office
EP0216276
EP 0216276
G01R 31/28
Semiconductor logic tester with fast-recovery power supply
Semiconductor logic tester with fast-recovery power supply - European Patent Office - EP 0216276 A3
Semiconductor logic tester with fast-recovery power supply - European Patent Office - EP 0216276 A3
Adobe PDF Library 8.0
"EP0216276"; "EP 0216276"; "G01R 31/28"; "Semiconductor logic tester with fast-recovery power supply"
1.4
1
B
2
EP
0216276
A3
1989-03-22
86112661
1986-09-12
US
780533
1985-09-26
G01R 31/28
International Business Machines Corporation
Prilik, Ronald J.
Rudack, Günter O., Dipl.-Ing.
Semiconductor logic tester with fast-recovery power supply
Halbleiterlogikprüfer mit Schnellerholungsstromversorgung
Semiconductor logic tester with fast-recovery power supply
Testeur logique de semi-conducteur à alimentation en courant à restauration rapide
The tester for logic circuits provided with fast-recovery power supply for supplying high current to a logic circuit under test and for measuring a low current of the circuit under test comprises first and second differential amplifiers (21,22) coupled to the CMOS circuit (10) being tested and having dual feedback loops with one loop controlling the resistance of the other loop. The first amplifier (21) is coupled between a reference voltage (25) and a capacitor (35) supplying current to the CMOS circuit (10) under test. The second amplifier (22) is coupled between the same reference voltage (25) and the output (32) of the first amplifier (21). Resistive feedback means (33) are coupled between the circuit (10) under test and the output (32) of the first amplifier (21), and an a.c.-coupled impedance switching means 140) is coupled between the output (37) of the second amplifier (22) and across the resistive feedback means (33), whereby the impedance switching means (40) can alter the impedance of the resistive feedback means (33) by shunting the latter to recharge the capacitor (35) supplying current to the circuit (10) under test.
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