(19)
(11) EP 0 031 732 A3

(12) EUROPEAN PATENT APPLICATION

(88) Date of publication A3:
02.06.1982 Bulletin 1982/22

(43) Date of publication A2:
08.07.1981 Bulletin 1981/27

(21) Application number: 80304758

(22) Date of filing: 30.12.1980
(84) Designated Contracting States:
AT DE FR GB SE

(30) Priority: 31.12.1979 US 108681

(71) Applicant: AMERICAN STERILIZER COMPANY
 ()

(72) Inventor:
  • NG, Sing Tai
     ()

   


(54) Light and particle image intensifier


(57) A light and charged particle image intensifier (10) receives incident image conveying light or charged particles {«incident beam») (12) and provides to data processing and video equipment signals from which the image conveyed by the incident beam (12) can be constructed and displayed. The beam (12) that is being processed includes visible light reflected from objects and X-ray radiation that has been passed through an object such as a human body. The image intensifier includes a scintillator (14) and photocathode unit (16) for converting the incident beam (12) to photoelectrons (18) and a charge-coupled device («CCD») (52) for detecting the photoelectrons (18) and transmitting to the data processing and video equipment information relating to the quantity or energy level as well as the location of the electrons (18) impinging on the sensing areas (54 or Sl to SN) of the CCD (52). From this information, the data processing and video equipment can reconstruct the image conveyed by the incident beam (12). The sensitivity of the device is increased either by imposing an electric field across the photocathode (16) and the CCD (52) to accelerate the photoelectrons or by placing a micro channel processor («MCP») (20) between the photocathode (16) and the CCD (52) to increase the number of electrons that impinge on the CCD (52). Alternately, a silicon diode target (42) can be used instead of a CCD (52) to intercept the electrons and an electron beam gun (44) can be used to detect the location and intensity of the charges created on the target (42) by the impinging electrons. Finally, a grid (24) having a number of windows can be used instead of a CCD (52) or a silicon target (42) to detect the location of the electron streams and a photoanode (25) can detect their intensity.







Search report