Technical Field
[0001] The invention relates to colloidal copper solutions containing palladium useful for
activating non-conductive substrates for subsequent electroless and electrolytic plating.
Background of The Invention
[0002] Numerous applications are found commercially today where it is desirable to have
a plastic, glass, or other like non-conductive substrate provided with a metal coating
on its surface either as a continuous coating or as a patterned or discontinuous coating.
Among the applications for such metal coated articles of normally non-conductive materials
are circuit boards, automobile hardware, various building and construction hardware,
toys, buttons, and the like.
[0003] In all such applications the process requires the activation of the non-conductive
substrate since electroplating cannot be carried out on such a substrate and electroless
plating will also not deposit on such non-conductive surfaces. The activation is followed
by an electroless plating which will carry a current for subsequent electroplating
or which can alternatively be . further electrolessly plated with the same or a different
metal.
[0004] Commercial prior art activating systems have generally relied upon one or more of
the nobel metals, such as palladium. A process that has been employed commercially,
involves a colloidal dispersion of palladium and tin chloride salts as disclosed in
U.S. Patent No. 3,011,920 to Shipley.
[0005] Before activation of the non-conductive substrate, it is generally subjected to various
cleaning and etching steps known in the art.
[0006] The U.S. Patent No. 3,011,920 to Shipley, referred to above, discloses the use of
colloidal dispersions of various metals in combination with reducing agents to achieve
activation of non-conductive substrates for subsequent electroless plating. The working
examples utilize noble metals or hydrous oxides thereof as the colloidal particles
and stannous chloride or tannic acid as a reducing agent. The specification in column
2 refers to the fact that other metals, including numerous non-noble metals such as
copper, may similarly be employed to catalyze non-conductive substrates for electroless
deposition.
[0007] The U.S. Patent No. 3,657,002 to Kenney discloses a process for preparing hydrous
oxide colloids of many different metals including both noble and non-noble metals
for treating or coating non-conducting substrates for subsequent electroless plating.
[0008] U.S. Patent No. 3,993,799 issued to Feldstein also discloses the use of a non-noble
metal hydrous oxide colloid for treating non-conductive substrates followed by reduction
of the hydrous oxide coating on the substrate to achieve at least a degree of activation
for subsequent electroless plating.
[0009] U.S. Patent No. 4,239,538 to Feldstein discloses solutions containing copper ions,
stannous ions and a phenol or creosol as a so-called linking agent for treatment of
non-conductive substrates for subsequent electroless plating, while Feldstein's U.S.
Patent No. 4,259,376 discloses an emulsion containing copper as the principal catalytic
agent and a catalytic promoter consisting of a number of non-noble metals to yield
an enhanced catalytic activity for electroless plating of non-conductive substrates.
[0010] U.S. Patent No. 3,958,048 to Donovan discloses a process for the surface activation
of non-conductive substrates for electroless plating by treating the surface of the
substrate with an aqueous composition containing catalytically active water insoluble
particles formed by a reaction of a non-noble metal and a water soluble hydride in
the presence of a water soluble organic suspending agent. Copper salts are disclosed
as one of the non-noble metals, dimethylamine borane (DMAB) as one of the hydrides,
and gelatin as one of the possible organic suspending agents.
[0011] The use of copper colloids for the activation of non-conductive substrates in place
of the palladium colloids has recently become commercial to a limited extent. With
the use of copper activating colloids it has generally been necessary to utilize a
fast electroless copper bath in order to obtain good coverage of the non-conductive
substrate by the electroless plating step. When the copper activating colloids are
utilized and a slow copper electroless bath employed, the degree of coverage of copper
by the electroless bath is decreased significantly. For example, when some copper
colloids are utilized with a fast bath, 100% coverage can be obtained, but when a
slow electroless bath is used the coverage obtained may only be on the order of 25
to 35 percent of the surface of the non-conductive substrate. Thus, one could say
that the catalytic activity of a copper colloid may be sufficient when employing a
fast copper electroless bath, but insufficient when a slow electroless copper bath
is employed. These electroless copper baths, fast and slow, are well known within
the industry, and can be characterized both by the deposition speed of the baths and
their stability. Generally, however, a fast electroless copper bath would be capable
of depositing about 100 micro inches of copper onto a conductive or activated surface
in about 30 minutes, while a slow electroless copper bath would be capable of depositing
35 to 40 micro inches of copper within about 30 minutes. Fast electroless copper baths
are less stable and can only be utilized for short periods of time if not properly
replenished and controlled. This instability is generally due to a rapid imbalance
and/or depletion of the chemical makeup of the baths during operation. Thus, these
fast baths must be frequently analyzed and adjusted to the desired chemical balance
in order to obtain electrolessly plated substrates suitable for subsequent electroplating
and commercial use. This is a cause of great concern in commercial production of such
items as circuit boards. A slow copper electroless bath, however, is quite stable
and can be used for long periods of time without chemical adjustments, and the use
of such bath is highly desired by industry, particularly where only a flash electroless
copper coating is desired or a deposit in the range of 35 to 40 micro inches in thickness.
This thickness is often desired in the production of circuit boards.
[0012] There are many variables which determine whether an electroless copper bath is fast
or slow. One of the more important factors in determining the speed of such baths
is the temperature used during the electroless plating operation and, to a lesser
extent, the amount of chemicals utilized to make up such baths. For example, a fast
bath can constitute an aqueous solution containing 8 ml/l of a 37% formaldehyde solution,
10 g/1 of sodium hydroxide, and 3 g/1 of copper metal supplied by a suitable salt,
such as copper sulfate. When operating this bath at about 120°F, it is considered
to be a fast bath and will deposit about 100 micro inches of copper onto a conductive
or properly activated surface in about 30 minutes. An example of a slow bath would
be an aqueous solution containing about 20 ml/l of a 37% formaldehyde solution, 15
g/l of sodium hydroxide, and 3 g/l of copper metal; again supplied to the solution
by means of a suitable salt. When this bath is operated at about 75°F or room temperature,
it is considered to be a slow bath and it will deposit between about 35 and 40 micro
inches of copper to a conductive or activated surface in about 30 minutes. When such
a slow bath is operated at higher temperatures, such as about 95°F, it becomes a fast
electroless copper bath. All of this is known in the art and the terms "slow" and
"fast" electroless copper baths are terms of the art.
[0013] All of these electroless copper baths also contain stabilizers and complexing agents
for the copper. These stabilizing and complexing agents are also well known in the
art. The applicant prefers to use divalent sulfur compounds as stabilizing agents,
such as those disclosed in the Schenble U.S. Patent No. 3,361,580, plus a small amount
of cyanide ion. The amount and type of stabilizing agent can be varied in these baths
depending upon whether the bath to be employed is a slow or fast bath. Generally it
is advisable to increase the amount of stabilizing agent when a fast bath is being
employed. This is also well known to those skilled in the art and regulation of the
stabilizing agent to obtain optimum stability will depend upon the makeup of the particular
bath being employed and the operating temperature of the bath.
[0014] The complexing agents are also well known in the art and include such materials as
the carboxylic acid type complexing agents, amine carboxylic acid complexing agents,
such as EDTA, aliphatic carboxylic acids, such as citric acid, tartarates, and Rochelle
salt.
Disclosure of The Invention
[0015] This invention comprises the discovery that the addition of a small amount of ionic
palladium (reducible to palladium metal) to copper colloid activating solutions significantly
increases the activation of the non-conductive surface and therefore the coverage
of the electroless copper deposition when utilizing a slow electroless copper bath.
For example, the coverage obtained by utilization of a slow electroless copper bath
with a palladiumless copper colloid can be increased from between 25 and 35 percent
coverage to 75 percent and above coverage. The extent of the increase in coverage
or catalytic activity will depend upon the particular copper colloid being employed,
but in all cases tested by the applicant, the increase in coverage has been found
to be very significant.
[0016] It is advantageous to add as little palladium metal as possible to the copper colloids
for economic reasons. A sufficient amount of palladium metal should be added to increase
the coverage of the electroless copper deposit to that desired. The most advantageous
amount of palladium metal has been determined to date to be about 20 parts per million
(ppm) although considerably lower amounts can be used. The mimimum amount of palladium
metal will also depend somewhat upon the speed of the electroless copper bath and
the particular ionizable palladium compound employed.
[0017] Although the applicant has given an example of a slow bath, which will deposit approximately
35 to 40 micro inches of copper in about 30 minutes, slightly faster baths could be
employed if the coverage is not sufficient. For example, if one obtains a coverage
of 90% with such an electroless copper bath, and desires higher coverage for subsequent
electro-deposition, one can increase the speed of the bath by appropriate chemical
adjustment or increase in the temperature to obtain the desired coverage so long as
the speed of the bath is not increased to a degree that the bath becomes fast or unstable.
For example, the electroless copper bath could be regulated to give a deposit of 50
to 60 micro inches to improve coverage while still maintaining the stability of the
bath. Increase-in the coverage may also be accomplished by regulation of the palladium
content.
[0018] The upper limit of palladium metal will depend upon the particular ionizable palladium
compound added to the bath, the effect of the anion of the ionizable palladium metal
on the stability of the bath, and the stability of the bath itself. Thus, one can
add the palladium metal in an amount which will still retain the stability of the
colloid. When utilizing a fairly stable colloid to begin with, the addition of palladium
metal as palladium tetra-ammonium chloride in excess of about 80 ppm of palladium
metal has been found to cause coagulation of the colloid and rendering it unstable.
With colloids which are less stable to begin with, the colloids may coagulate or be
rendered unstable when amounts of palladium metal are added thereto of less than about
80 ppm. Thus, the maximum amount of palladium metal that is added is that which will
retain sufficient stability of the colloid so that the non-conductive substrate can
be adequately activiated by the colloid for subsequent electroless plating.
[0019] The palladium is added to the colloid in the ionic state. Experiments to date have
shown that most any palladium compounds or salts capable of ionization and reduction
can be used, such as the palladium chloride acid salt and palladium tetra-ammonium
chloride; the latter being presently preferred. The addition of palladium metal, from
commercial colloidal palladium activating catalysts in the amount of 20 ppm of the
palladium metal, causes precipitation or coagulation of the copper colloid, and when
an attempt is made to use this copper colloid containing the palladium metal added
from a palladium activating colloid, zero coverage is obtained when utilizing a slow
electroless copper bath. When utilizing a palladium metal colloid containing 20 ppm
of palladium alone without the presence of the copper colloid, only 60% coverage is
obtained from the slow electroless copper baths.
[0020] The ionic palladium added to the copper colloid is reduced at some stage to palladium
metal prior to electroless plating. Thus, the palladium compounds can be added directly
to the copper colloid if it contains an excess of reducing agent or during the preparation
of the colloid if the colloid is prepared by a reduction technique, such as disclosed
in the above U.S. patent to Donovan. The palladium can also be added to colloids prepared
by a precipitation process, such as disclosed in the Feldstein Patent No. 3,993,799
and the ionic palladium reduced after the colloid has been coated on the non-conductive
substrate by immersion of the coated substrate into a reducing agent.
[0021] In all of the following examples, the test panels were composed of the standard glass-epoxy
material normally used in the production of printed circuits and containing no copper
cladding. The electroless copper bath utilized was a slow copper bath containing 20
ml/l of 37% formaldehyde, 15 g/1 of sodium hydroxide, 3 g/1 of copper metal as copper
sulfate, a divalent sulfur stabilizer, such as disclosed in-U.S. Patent 3,361,580,
in a sufficient amount to stabilize the bath, an amine carboxylic acid complexing
agent for the copper and a small amount of cyanide ion. The bath was operated at 75°F.
The palladium metal was added as palladium tetra-ammonium chloride. The time of immersion
in the electroless copper bath was approximately 30 minutes.
Example 1
[0022] A copper colloid was prepared in accordance with Example 2 of the Donovan Patent
No. 3,958,048, and a glass filled epoxy panel was immersed in the colloid, and an
attempt was made to electrolessly plate the treated panel with the above-noted slow
electroless copper bath. No coverage or plating of copper was noted after 30 minutes
immersion time. 20 ppm of palladium metal was then added to this same colloid as palladium
tetra-ammonium chloride. The palladium ammonium chloride was added to the colloid
after its preparation since the prepared colloid contained sufficient excess reducing
agent capable of reducing the ionic palladium contained therein to palladium metal.
The panel was activated by the copper colloid containing the palladium by immersion,
and then electrolessly plated with the same copper bath. The coverage of the electroless
deposit on the panel was found to be about 70% after 30 minutes.
Example 2
[0023] An hydrous oxide colloid was prepared according to Example 12 of the Feldstein Patent
3,993,799 by the precipation method utilizing copper acetate and ammomium hydroxide.
This hydrous oxide colloid was then used to coat the glass epoxy panel and the hydrous
oxide reduced by immersing the treated panel into a potassium borohydride solution.
The panel was then subjected to electroless deposition by means of the slow electroless
copper bath described above. The coverage obtained from the electroless copper bath
was approximately 25%.
[0024] 20 ppm of palladium ammonium chloride was added to the same hydrous oxide colloid
described above prior to reduction of the coated panel and a panel coated therewith.
After reduction in the same potassium borohydride solution, and electroless plating
with the same electroless copper solution, an 80% coverage of the panel was obtained.
Example 3
[0025] A copper colloid was prepared in accordance with Example 4 of the Feldstein Patent
No. 4,259,376 without the manganese chloride. The standard glass epoxy panel was treated
with this colloid and subjected to the standard electroless solution as described
above. The coverage of the electroless copper was found to be about 20%.
[0026] Example 4 of Feldstein was again repeated adding the manganese chloride and the coverage
of the electroless copper deposition was found to be about 35%. When the same colloid
was produced and 20 ppm of palladium tetra-ammonium chloride added thereto in place
of the manganese chloride, and the procedure repeated, the coverage from the standard
slow electroless copper bath was found to be approximately 75%.
[0027] The types of non-conductive substrates that can be activated according to this invention
are the same as those disclosed in the patents referred to above. The colloids of
the invention are particularly advantageous for activating plastics such as epoxy-glass,
phenolic glass, ABS-glass, phenolic-paper, etc., and the non-conductive portions of
laminated circuit boards. These circuit boards, as is well known, are generally composed
of such plastic compositions having two thin sheets of copper foil laminated to both
sides of the plastic and having appropriate holes drilled through both copper sheets
and the plastic. The plastic portions of the laminate, such as that exposed by the
drilled holes, must be electroplated to provide continuity of electric conductivity
throughout the circuit board. Thus, the exposed plastic portion of the laminate must
be activated for electroless metal plating and subsequent electro metal plating.
[0028] To activate such circuit boards, it is advantageous to use colloids which have a
particle size of between about 10 and 100 millimicrons, a particle zeta potential
of between about +3 and +13 millivolts (MV), advantageously between about 4 and 10
MV, and which colloid contains a sufficient number of particles to sufficiently activate
the surface of the non-conductor so it can be successfully electrolessly plated.
[0029] Actually the colloidal copper particles themselves do not have a zeta potential of
between about +3 and +13 MV. The particles are altered by treatment with the suspending
or stabilizing agent to possess the desired zeta potential. Thus, the suspending agent
itself has a zeta potential of a sufficient value to form a composite particle which
has the desired zeta potential or somehow alters the zeta potential of metallic copper
and/or copper oxide particles to within the desired range. Thus, a stabilizing agent
may have a zeta potential of about +18 MV when combined with copper particles having
a minus zeta potential causing the composite particles so formed to have a zeta potential
within the desired range of +3 to +13 MV. It would be routine for a person skilled
in the art to measure zeta potentials and select the correct suspending agent to produce
a colloid having the desired zeta potential. Not all suspending agents will give the
desired zeta potential; it depends on the purity of the suspending agent and/or the
manner in which it was produced or purified, the presence or absence of ions, etc.
An example of such a suspending agent is acid washed Type A gelatin. It should also
be a relative pure Type A gelatin, free of significant impurities, such as excess
sodium ions, that would interfere with obtaining the desired zeta potential. Other
suspending agents could be used in place of gelatin, so long as they possess the desired
zeta potential and do not highly disassociate and migrate from the copper particles.
[0030] The invention does not exclude reduction of the ionizable palladium compound in a
solution separate from the copper colloid in the presence of a suitable suspending
agent such as gelatin and adding the palladium metal in this form during or after
the preparation of the copper colloid even though such a process is somewhat more
complicated.
1. The method of preparing a copper colloid for activation of a non-conducting substrate
which comprises adding a minor amount of an ionizable palladium compound to the copper
colloid and reducing the palladium compound therein to form metallic palladium particles
in an amount sufficient to maintain the copper colloidal particles as the primary
activating agent.
2. The method of claim 1 in which the copper colloid contains excess reducing agent
after its preparation and the palladium compound is added thereto after the copper
colloid has been prepared.
3. The method of activating a non-conducting substrate comprising treating the substrate
with a composition containing a minor amount of an ionizable palladium compound and
a major amount of hydrous oxide copper colloid particles containing an insufficient
amount of reducing agent to reduce the ionizable palladium compound to palladium metal
and reducing the hydrous oxide colloid and the ionizable palladium compound to metallic
copper and metallic palladium while adhered to said conducting substrate and in which
the metallic copper is the primary activating agent.
4. An aqueous copper colloid for the activation of non-conductive substrates for subsequent
electroless plating comprising colloidal particles of metallic copper and a minor
amount of palladium metallic particles formed by reduction of an ionizable palladium
compound within said copper colloid after or during preparation of the copper colloid
by reduction of a copper compound.
5. The colloid of claim 4 in which the palladium are reduced to metallic form from
palladium and copper and copper compounds in the presence of a suspending agent such
as gelatin.
6. The colloid according to claim 5 in which the palladium compound is separately
reduced to metallic palladium in the presence of a suspending agent such as gelatin
and is subsequently added to the copper colloid during or after preparation of the
copper colloid.
7. A non-conductive substrate having activating sites thereon sufficient to permit
electroless plating thereon in which the activated sites comprise a mixture of a major
amount of copper metal and a minor amount of palladium metal.
8. A stable aqueous colloid for the activation of non-conductive substrates for electroless
plating which comprises particles of metallic copper and/or copper oxide having a
particle size of between about 10 and 100 millimicrons and having a zeta potential
between about +3 and +13 millivolts, said colloid having an amount of particles to
activate the surface of a non-conductor and containing a minor proportion of palladium
produced by reduction and from an ionizable palladium compound within said colloid
or during preparation of the colloid by reduction of a copper compound or by a separate
reduction of the palladium in the presence of a colloid such as gelatin.