<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE ep-patent-document PUBLIC "-//EPO//EP PATENT DOCUMENT 1.4//EN" "ep-patent-document-v1-4.dtd"><!-- Disclaimer: This ST.36 XML data has been generated from SGML data available on ESPACE discs EPAS Volumes 2003/201 to 203 enriched by the abstract retrieved from the corresponding A2/A1 document - March 2013 - EPO - Dir. Publication - kbaumeister@epo.org --><ep-patent-document id="EP83306545A3" lang="en" country="EP" doc-number="0121019" date-publ="19841114" file="83306545" kind="A3" status="n" dtd-version="ep-patent-document-v1-4"><SDOBI lang="en"><B000><eptags><B001EP>ATCHDEFRGBITLISE</B001EP></eptags></B000><B100><B110>0121019</B110><B120><B121>EUROPEAN PATENT APPLICATION</B121></B120><B130>A3</B130><B140><date>19841114</date></B140><B190>EP</B190></B100><B200><B210>83306545</B210><B220><date>19831027</date></B220></B200><B300><B310>481953</B310><B320><date>19830404</date></B320><B330><ctry>US</ctry></B330></B300><B400><B405><date>19841114</date><bnum>198446</bnum></B405><B430><date>19841010</date><bnum>198441</bnum></B430></B400><B500><B510><B511> 6C 23C  15/00   A</B511></B510><B540><B541>en</B541><B542>Rapid rate reactive sputtering of a group IVb metal</B542><B541>fr</B541><B542>Pulvérisation cathodique réactive à grande vitesse d'un métal du groupe IVb</B542><B541>de</B541><B542>Reaktive Kathodenzerstäubung eines Metalles der Gruppe IVb bei hoher Geschwindigkeit</B542></B540></B500><B700><B710><B711><snm>BORG-WARNER CORPORATION</snm></B711></B710><B720><B721><snm>Sproul, William Dallas</snm></B721><B721><snm>Tomashek, James Raymond</snm></B721></B720></B700><B800><B840><ctry>AT</ctry><ctry>CH</ctry><ctry>DE</ctry><ctry>FR</ctry><ctry>GB</ctry><ctry>IT</ctry><ctry>LI</ctry><ctry>SE</ctry></B840><B880><date>19841114</date><bnum>198446</bnum></B880></B800></SDOBI><abstract id="abst" lang="en"><p id="pa01" num="0001">A metal from group IVb of the periodic table is used as the target in a reactive deposition process. An inert gas such as argon is admitted within the chamber (12) housing the target (21). Electrical power at a constant level is supplied to the target, ionizing the inert gas so that the ions bombard the metal target and initiate sputtering. A controlled flow of a reactive gas such as nitrogen is then admitted to the chamber and controlled in such a way that the metal deposition rate is not lowered. The amount of the reactive gas is constantly sampled to provide a control signal used to regulate admission of the reactive gas at the proper rate for most effective deposition of the metal onto the substrate. Closed loop systems (45, 29, 31, 43, 44, 26, 27, 39, 62) regulate the level of electrical power supplied to the target, rate of admission of the inert gas, and rate of admission of the reactive gas.</p></abstract><search-report-data lang="en" id="srep" srep-office="EP" date-produced=""><doc-page id="srep0001" file="srep0001.tif" type="tif" orientation="portrait" he="295" wi="208" /><doc-page id="srep0002" file="srep0002.tif" type="tif" orientation="portrait" he="295" wi="208" /></search-report-data></ep-patent-document>