(19)
(11) EP 0 130 974 A1

(12)

(43) Date of publication:
16.01.1985 Bulletin 1985/03

(21) Application number: 83900478.0

(22) Date of filing: 27.12.1982
(51) International Patent Classification (IPC): 
G01R 31/ 3185( . )
(86) International application number:
PCT/US1982/001819
(87) International publication number:
WO 1984/002580 (05.07.1984 Gazette 1984/16)
(84) Designated Contracting States:
AT BE CH DE FR GB LI LU NL SE

(71) Applicant: STORAGE TECHNOLOGY PARTNERS
Santa Clara CA 95051 (US)

(72) Inventor:
  • ZASIO, John, J.
    Sunnyvale, CA 94087 (US)

   


(54) VLSI CHIP WITH INTEGRAL TESTING CIRCUIT