[0001] The present invention relates in general to a thin film electroluminescent display
device and is concerned, more particularly, with an improved dark field material for
such a thin film electroluminescent display device.
[0002] Electroluminescent devices generally comprise a phosphor layer disposed between two
electrode layers with one of the electrodes being transparent so as to permit viewability
of the phosphor layer. It is known to provide a dark field layer behind the phosphor
layer in order to improve the contrast ratio of the device when using a segmented
back electrode layer; that is to say, to provide visibility of the phosphor layer
overlying the back electrode segments even under ambient conditions of high brightness.
See U.S. Patent 3,560,784 for an example of a dark field layer, the material of which
may comprise arsenic sulphide, arsenic selenide, arsenic sulfoselenide or mixtures
thereof. However, these arsenic compounds either do not provide a satisfactory dark
color or they change color during use.
[0003] Perhaps the most common dark field material presently being used is cadmium telluride
(CdTe). Although the CdTe layer provides for enhancement in contrast between the displayed
information and the background, one of the problems associated with the CdTe composition
is that it is toxic and the material does not meet safety specifications for commercial
products as required by OSHA (Occupational Safety and Health Act).
[0004] One solution to this toxicity problem is described in copending application U.S.
Serial No. 262,097, filed May 11, 1981 and assigned to the present assignee, which
defines an electroluminescent device having a dark field layer comprising a cermet
of chromium oxide - chromium (
Cr203/Cr). Although overcoming the toxicity problem, this cermet comprises a combination of
a metal (Cr) and an oxide (Cr 0 ) of the same base metal, thereby rendering the dark
field composition difficult, if not impossible, for analysis of the constituent proportions.
Such analysis is important to enable precise control of the constituent proportion
for providing optimum results.
[0005] Accordingly, it is an object of the present invention to provide an improved electroluminescent
display device and in particular an improved dark field material for such a device.
[0006] Another object of the present invention is to provide an improved dark field in accordance
with the preceding object and which is characterized by an improved contrast ratio
of the device.
[0007] Still another object of the present invention is to provide a dark field material
in accordance with the preceding objects and which is non-toxic and meets the safety
specifications for commercial products required by OSHA.
[0008] A further object of the present invention is to provide an improved dark field layer
in a thin film electroluminescent display device in which for at least some applications,
only a single transparent dielectric layer of the device is employed in comparison
with the typical first and second transparent dielectric layers used in the past in
electroluminescent thin film display devices.
[0009] Still a further object of the present inventipn is to provide an improved dark field
material for a thin film electroluminescent display device in which the dark field
layer is formed of constituents which are readily analyzable, and thus precisely controllable,
to provide enhanced flexibility in controlling parameters of the dark field layer
such as contrast ratio.
SUMMARY OF THE INVENTION
[0010] To accomplish the foregoing and other objects of this invention, there is provided
an improved dark field material for a thin film electroluminescent display device,
which display device typically comprises an electroluminescent phosphor layer disposed
between two electrode layers with one of the electrodes being transparent to permit
viewability of the phosphor layer. The improved dark field layer in accordance with
the present invention comprises a composition of a dielectric material, preferably
a ceramic, in combination with a noble metal, which in the preferred embodiment is
gold. The ceramic is preferably magnesium oxide. The preferred composition of magnesium
oxide and gold may be formed by a sputtering technique, examples of which are described
in further detail hereinafter.
BRIEF DESCRIPTION OF THE DRAWINGS
[0011] Numerous other objects, features and advantages of the invention should now become
apparent upon a reading of the following detailed description taken in conjunction
with the accompanying drawing, in which:
FIG. 1 is a schematic cross-sectional view showing the multiple layers of a thin film
electroluminescent display device including the dark field layer of this invention;
and
FIG. 2 is a schematic cross-sectional view showing an alternative construction of
the thin film electroluminescent display device showing a single transparent dielectric
layer rather than the two dielectric layers depicted in FIG. 1.
DESCRIPTION OF PREFERRED EMBODIMENT
[0012] In accordance with the present invention, the dark field material for a thin film
electroluminescent display device is formed by a composition of a dielectric material
with a noble metal. The dark field layer serves the basic purpose of enhancing the
contrast between the displayed information which is usually in segment form and the
background. In order to. eliminate the prior art problem associated with CdTe dark
field layers, which are toxic, and yet provide suitable analyzability of the dark
field composition, it has been found in accordance with the present invention that
a composition of, for example, magnesium oxide and gold which are co-evaporated, preferably
by an electron beam technique, provide a dark field material that is non-toxic, is
readily analyzable and meets the safety specifications for commercial products. A
layer of such material has not previously been employed at all in the construction
of electroluminescent display devices, although, a MgO/Au film has been previously
evaluated as a solar absorbing material for solar panels. In this regard, see U.S.
Patent 4,312,915; also see the article by Fan and Zavracky, Applied Physics Letters,
Volume 29, No. 8, 15 October, 1976, page 478-480. Also see the article by Berthier
and Lafait in Thin Solid Films 89 (1982) 213-220 entitled "Optical Properties of Au-HgO
Cermet Thin Films: Percolation Threshold and Grain Size Effect". The latter article
is concerned primarily with the method of deposition and associated optical properties.
[0013] In addition to the advantage of non-toxicity of the composition of this invention,
the layer has also been found to unexpectedly provide contrast enhancement.
[0014] With reference to the drawing, it is noted that in FIG. 1 there is shown a version
of an electroluminescent display device incorporating the dark field of this invention.
In FIG. 2, one of the two transparent dielectric layers shown in FIG. 1 has been removed
because, in accordance with the present invention, the improved dark field layer also
functions as a substitute for one of the dielectric layers. In other words the dielectric/noble
metal composition serves both as the dark field and as the second dielectric.
[0015] In FIGS. 1 and 2, like reference characters are used to identify like layers of each
embodiment disclosed. Thus, there is shown a glass substrate 10 on which are formed
a number of multiple thin-film layers, which may be enclosed by a glass seal 11. These
layers include a transparent electrode 12, a first transparent dielectric layer 14,
an electroluminescent phosphor layer 16, a second transparent dielectric layer 18,
a dark field layer 20, and a back segmented-electrode 22. In FIGS. 1 and 2 the transparent
dielectric layers may be of yttria, and the electroluminescent phosphor layer may
be of, for example, zinc sulphide. In the embodiment of FIG. 1, the second transparent
dielectric layer 18 is shown, but it is noted that in the embodiment of FIG. 2, this
layer is not present.. The dark field layer 20 in FIG. 2 instead serves both as the
dark field and as the second dielectric layer.
[0016] The composition of the dark field layer 20, which in its broadest sense comprises
a dielectric material, preferably a ceramic, and a noble metal, preferably gold, may
be deposited by co-evaporation using standard deposition techniques. In accordance
with one technique, co-evaporation is used with e-beam equipment. The evaporation
may take place in one chamber of a two-chamber system. The two chamber system has
two e-beam guns, each with its own power supply. In the preferred version, magnesium
oxide may be in pellet form and loaded into one crucible, and gold is disposed in
the second crucible. The deposition may be measured by means of conventional crystal
monitors. One crystal monitor is placed over each crucible being disposed as close
as possible to the position where the substrate is. The co-evaporation technique using
separate crucibles is carried out in a vacuum of preferably better than 1 x 10
-5 torr. The volume percentage of gold is varied with the gold concentration preferably
in the range of 6%-10% by volume. The percentage of gold in the composition is instrumental
in controlling the resistivity of the cermet. With regard to the control of gold (noble
metal) concentration, reference is now made to a co-pending application Serial No.
(attorney's docket No. 22,429) filed of even date herewith and assigned to the present
assignee.
[0017] In one test that was carried out, the dark field layer had a thickness of 0.5 micron.
The preferred film thickness is in the range of 5000-9000 Angstroms. The lateral resistance
between back electrode segments is on the order of 10 megohms while the perpendicular
resistance across the film thickness is on the order of lK ohm or 1ess. A contrast
ratio of 2:1 is measured at an ambient light level of 2500 foot-candles with the back
electrode segments at 160 volts and 60 foot-lamberts. With those parameters, display
devices have been operated successfully up to 500 hours of operating time.
[0018] With regard to measurements of contrast between the displayed information and the
background, such measurements have been taken by shining a Sylvania Sun-Gun lamp at
the lighted and unlighted display segments. The Sun-Gun lamp was set at an output
of 3500 foot-candles. In two different respective devices that were tested, the contrast
ratio measured was 4.2 and 5.3, respectively.
[0019] In accordance with another technique for forming the dark field layer, sputtering
may be used in a reactive atmosphere of say argon and oxygen in a ratio of 70%-30%,
respectively.
[0020] One of the primary advantages of the composition MgO/Au is that the material itself
as well as the process forming it, is non-toxic. Also, the admixed metal (Au) and
the metal of the metal oxide (Mg) are two different materials and thus the ratio between
these constituents is readily analyzable and, thus, provides for an added degree of
control over such parameters of the dark field layer as electrical conductivity and
optical absorption.
[0021] Reference has been made to the preferred layer construction of magnesium oxide and
gold. However, it is understood that in accordance with other embodiments of the invention
the composition may comprise other noble metals in place of the gold such as platinum
or silver. The dielectric portion of the composition may be a ceramic. This can be
a metal oxide or a metal nitride (such as aluminum nitride) or can even be a semiconductor
such as silicon dioxide or germanium dioxide. The noble metal portion of the composition
is in the form of a relatively stable metal thus not tending to react with the metallic
in the ceramic portion of the composition. The noble metal, such a gold does not readily
oxidize if it is mixed-with the magnesium oxide.
[0022] Having now described a limited number of embodiments of the present invention, it
should now be apparent to those skilled in the art that numerous other embodiments
are contemplated as falling within the scope of this invention as defined by the appended
claims, for example, the dark field layer may be deposited by techniques other than
co-evaporation or electron beam evaporation, such as by sputtering.
[0023] What is claimed is:
1. An electroluminescent display device comprising a transparent electrode layer,
a segmented electrode layer, an electroluminescent phosphor layer disposed between
said electrode layers, and a dark field layer of a composition of a dielectric material
with a noble metal, said dark field layer being interposed between said electroluminescent
phosphor layer and said segmented electrode layer.
2. An electroluminescent display device as set forth in claim 1 including only-a single
transparent dielectric layer adjacent the electroluminescent phosphor layer.
3. An electroluminescent display device as set forth in claim 1 wherein the dark field
layer has a film thickness in the range of 5000-9000 Angstroms.
4. An electroluminescent display device as set forth in claim 1 wherein the device
has a contrast ratio of at least 2:1.
5.. An electroluminescent display device as set forth in claim 1 wherein the composition
of the dark field layer is deposited by co-evaporation from separate sources.
6. An electroluminescent display device as set forth in claim 1 wherein the noble
metal comprises gold.
7. An electroluminescent display device as set forth in claim 1 wherein said dielectric
material of the dark field layer comprises a metal oxide.
8. An electroluminescent display device as set forth in claim 7 wherein said metal
oxide comprises magnesium oxide.
9. An electroluminescent display device as set forth in claim 1 wherein said dielectric
material of the dark field layer comprises silicon dioxide.
10. An electroluminescent display device as set forth in claim 1 wherein said dielectric
material of the dark field layer comprises germanium dioxide.
11. An electroluminescent display device as set forth in claim 1 wherein said dielectric
material of the dark field layer comprises aluminum nitride.
12. An electroluminescent display device as set forth in claim 1 wherein said dielectric
material of the dark field layer is comprised of a metal oxide, a metal nitride or
a semiconductor.