APPARATUS FOR THE PRACTICE OF DOUBLE EXPOSURE INTERFEROMETRIC NON-DESTRUCTIVE TESTING - Patent 0167530

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EP 0 167 530 A1

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(43)	Date of publication:
	15.01.1986 Bulletin 1986/03

(21)	Application number: 84900655.0

(22)	Date of filing: 05.01.1984

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International Patent Classification (IPC):

G01B 9/ 025^{( . )}
G01B 11/ 16^{( . )}

G01B 9/ 021^{( . )}
G01N 3/ 12^{( . )}

(86)	International application number:
	PCT/US1984/000002

(87)	International publication number:
	WO 1985/003123 (18.07.1985 Gazette 1985/16)

(84)	Designated Contracting States:
	CH DE FR GB LI NL

(71)	Applicant: INDUSTRIAL HOLOGRAPHICS, INC.
	Auburn Heights, MI 48057 (US)

(72)	Inventor:
	GRANT, Ralph, M. Rochester, MI 48063 (US)

(74)	Representative: Schaumburg, Thoenes & Thurn
	Mauerkircherstrasse 31 D-81679 München D-81679 München (DE)

(54)	APPARATUS FOR THE PRACTICE OF DOUBLE EXPOSURE INTERFEROMETRIC NON-DESTRUCTIVE TESTING