(19)
(11) EP 0 167 601 A1

(12)

(43) Date of publication:
15.01.1986 Bulletin 1986/03

(21) Application number: 85900572.0

(22) Date of filing: 27.12.1984
(51) International Patent Classification (IPC): 
G01J 3/ 45( . )
G01J 9/ 02( . )
G01J 3/ 453( . )
(86) International application number:
PCT/US1984/002134
(87) International publication number:
WO 1985/003122 (18.07.1985 Gazette 1985/16)
(84) Designated Contracting States:
BE CH DE FR GB LI NL SE

(30) Priority: 16.01.1984 US 19840571175

(71) Applicant: OHIO UNIVERSITY
Athens, OH 45701 (US)

(72) Inventor:
  • WILLIAMS, Ronald, R.
    Athens, OH 45701 (US)

(74) Representative: Baillie, Iain Cameron, et al 
c/o Ladas & Parry Altheimer Eck 2
D-80331 München
D-80331 München (DE)

   


(54) INTERFEROMETRIC DIODE ARRAY SPECTROMETER