(19)
(11)
EP 0 167 601 A1
(12)
(43)
Date of publication:
15.01.1986
Bulletin 1986/03
(21)
Application number:
85900572.0
(22)
Date of filing:
27.12.1984
(51)
International Patent Classification (IPC):
G01J
3/
45
( . )
G01J
9/
02
( . )
G01J
3/
453
( . )
(86)
International application number:
PCT/US1984/002134
(87)
International publication number:
WO 1985/003122
(
18.07.1985
Gazette 1985/16)
(84)
Designated Contracting States:
BE CH DE FR GB LI NL SE
(30)
Priority:
16.01.1984
US 19840571175
(71)
Applicant:
OHIO UNIVERSITY
Athens, OH 45701 (US)
(72)
Inventor:
WILLIAMS, Ronald, R.
Athens, OH 45701 (US)
(74)
Representative:
Baillie, Iain Cameron, et al
c/o Ladas & Parry Altheimer Eck 2
D-80331 München
D-80331 München (DE)
(54)
INTERFEROMETRIC DIODE ARRAY SPECTROMETER