SAMPLE SIGNAL FOR INTERFEROGRAM GENERATION AND METHOD FOR OBTAINING SAME - Patent 0179151

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EP 0 179 151 A1

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(43)	Date of publication:
	30.04.1986 Bulletin 1986/18

(21)	Application number: 85902731.0

(22)	Date of filing: 12.04.1985

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International Patent Classification (IPC):

G01J 3/ 45^{( . )}

G01J 3/ 453^{( . )}

(86)	International application number:
	PCT/US1985/000691

(87)	International publication number:
	WO 1985/004713 (24.10.1985 Gazette 1985/23)

(84)	Designated Contracting States:
	AT BE CH DE FR GB IT LI LU NL SE

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Priority:

13.04.1984 US 19840599859

(71)	Applicant: BECKMAN INSTRUMENTS, INC.
	Fullerton California 92634 (US)

(72)	Inventors:
	STACHELEK, Thomas, M. Fullerton, CA 92631 (US) ANDERSON, Philip, D. Corona del Mar, CA 92625 (US)

(74)	Representative: Wotherspoon, Graham, et al
	FITZPATRICKS 4 West Regent Street Glasgow G2 1RS Scotland Glasgow G2 1RS Scotland (GB)

(54)	SAMPLE SIGNAL FOR INTERFEROGRAM GENERATION AND METHOD FOR OBTAINING SAME