AUTOMATIC MONOCHROMATOR-TESTING SYSTEM

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EP 0 186 704 A1

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(43)	Date of publication:
	09.07.1986 Bulletin 1986/28

(21)	Application number: 85903529.0

(22)	Date of filing: 24.06.1985

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International Patent Classification (IPC):

G01J 1/ 42^{( . )}
G01J 3/ 04^{( . )}
G01N 21/ 25^{( . )}
G01J 3/ 18^{( . )}
G01J 3/ 433^{( . )}

G01J 3/ 02^{( . )}
G01J 3/ 10^{( . )}
G01J 3/ 12^{( . )}
G01J 3/ 28^{( . )}

(86)	International application number:
	PCT/US1985/001184

(87)	International publication number:
	WO 1986/000406 (16.01.1986 Gazette 1986/02)

(84)	Designated Contracting States:
	DE FR GB

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Priority:

29.06.1984 US 19840626292

(71)	Applicant: AMERICAN MONITOR CORPORATION
	Indianapolis, IN 46268 (US)

(72)	Inventor:
	MEIER, Daniel, J. Indianapolis, IN 46234 (US)

(74)	Representative: UEXKÜLL & STOLBERG
	Patentanwälte Beselerstrasse 4 D-22607 Hamburg D-22607 Hamburg (DE)

(54)	AUTOMATIC MONOCHROMATOR-TESTING SYSTEM