PASS-THROUGH TEST SOCKET FOR SEMICONDUCTOR DEVICES

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EP 0 190 164 A1

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(43)	Date of publication:
	13.08.1986 Bulletin 1986/33

(21)	Application number: 85903108.0

(22)	Date of filing: 31.05.1985

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International Patent Classification (IPC):

G01R 1/ 04^{( . )}

(86)	International application number:
	PCT/US1985/001020

(87)	International publication number:
	WO 1986/001133 (27.02.1986 Gazette 1986/05)

(84)	Designated Contracting States:
	DE FR GB IT NL SE

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Priority:

17.08.1984 US 19840641619

(71)	Applicant: MOTOROLA, INC.
	Schaumburg, IL 60196 (US)

(72)	Inventor:
	FRISBIE, Milo, W. Mesa, AZ 85208 (US)

(54)	PASS-THROUGH TEST SOCKET FOR SEMICONDUCTOR DEVICES