(19)
(11) EP 0 237 259 A3

(12) EUROPEAN PATENT APPLICATION

(88) Date of publication A3:
05.04.1989 Bulletin 1989/14

(43) Date of publication A2:
16.09.1987 Bulletin 1987/38

(21) Application number: 87301870.9

(22) Date of filing: 04.03.1987
(51) International Patent Classification (IPC)4: H01J 49/42
(84) Designated Contracting States:
CH DE FR GB IT LI NL SE

(30) Priority: 07.03.1986 US 837600

(71) Applicant: FINNIGAN CORPORATION
San Jose California 95134 (US)

(72) Inventor:
  • Syka, John Edward Philip
    Sunnyvale California 94086 (US)

(74) Representative: Alexander, Thomas Bruce et al
Boult, Wade & Tennant 27 Furnival Street
London EC4A 1PQ
London EC4A 1PQ (GB)


(56) References cited: : 
   
       


    (54) Mass spectrometer


    (57) A mass spectrometer includes an ion source (11) for projecting ions along a predetermined path, a detector (31, 32, 33) offset from said path, a quadrupole ion filter or analyzer (26) disposed adjacent said detector (31, 32, 33) to provide its output to the detector, and quadrupole means (36) for directing ions away from said path into said ion filter and analyzer (26). Such a spectrometer produces relatively low noise levels.







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